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Aging mechanisms of X2 metallized film capacitors in a high temperature and humidity environment

Aging mechanisms of X2 metallized film capacitors in a high temperature and humidity environment
Aging mechanisms of X2 metallized film capacitors in a high temperature and humidity environment
Safety capacitors (usually denoted as X1, X2 or Y) are metallized film capacitors (MFC). Two kinds of capacitance loss mechanism typically occur in this metallized film structure: (1) caused by self-healing resulting in a very small electrode area loss; (2) caused by electrode oxidation by electrochemical corrosion under ac stress in a humid environment. This study focuses on the aging mechanism of X2 film capacitors working in high temperature and high humidity environments. Two types of X2 film capacitors have been stressed under an applied voltage of 270Vac at 85 ¼C, 78.68%RH. Capacitance and equivalent series resistance (ESR) were monitored during the experiment as parametric parameters that reflect the aging process. The aging mechanism including moisture ingress time were calculated and comprehensively analyzed with the capacitance change characteristics. It was found that capacitors with lower aluminum metallization has a better capacitance stability, the mean corrosion rate of Type2 (9.7% aluminum metallization) is more than 3 times of the Type1(6.9% aluminum metallization).The ingress time calculated by capacitance change and normalized ESR show reasonable agreement.
Li, H.
e6f231b5-28cd-425f-b136-55ceab5d00db
Lewin, P.L.
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Fothergill, J.C.
30b3e741-3463-4cc0-9f74-f61a3ea75c8f
Li, H.
e6f231b5-28cd-425f-b136-55ceab5d00db
Lewin, P.L.
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Fothergill, J.C.
30b3e741-3463-4cc0-9f74-f61a3ea75c8f

Li, H., Lewin, P.L. and Fothergill, J.C. (2016) Aging mechanisms of X2 metallized film capacitors in a high temperature and humidity environment. 2016 IEEE International Conference on Dielectrics, Montpellier, France. 02 - 06 Jul 2016. 4 pp . (doi:10.1109/ICD.2016.7547738).

Record type: Conference or Workshop Item (Other)

Abstract

Safety capacitors (usually denoted as X1, X2 or Y) are metallized film capacitors (MFC). Two kinds of capacitance loss mechanism typically occur in this metallized film structure: (1) caused by self-healing resulting in a very small electrode area loss; (2) caused by electrode oxidation by electrochemical corrosion under ac stress in a humid environment. This study focuses on the aging mechanism of X2 film capacitors working in high temperature and high humidity environments. Two types of X2 film capacitors have been stressed under an applied voltage of 270Vac at 85 ¼C, 78.68%RH. Capacitance and equivalent series resistance (ESR) were monitored during the experiment as parametric parameters that reflect the aging process. The aging mechanism including moisture ingress time were calculated and comprehensively analyzed with the capacitance change characteristics. It was found that capacitors with lower aluminum metallization has a better capacitance stability, the mean corrosion rate of Type2 (9.7% aluminum metallization) is more than 3 times of the Type1(6.9% aluminum metallization).The ingress time calculated by capacitance change and normalized ESR show reasonable agreement.

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More information

Accepted/In Press date: 31 May 2016
Published date: 3 July 2016
Additional Information: CD-ROM
Venue - Dates: 2016 IEEE International Conference on Dielectrics, Montpellier, France, 2016-07-02 - 2016-07-06
Organisations: EEE

Identifiers

Local EPrints ID: 397740
URI: http://eprints.soton.ac.uk/id/eprint/397740
PURE UUID: 9a5dd5a3-e50e-4351-9353-03e18fbce64c

Catalogue record

Date deposited: 05 Jul 2016 07:13
Last modified: 21 Nov 2021 02:30

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Contributors

Author: H. Li
Author: P.L. Lewin
Author: J.C. Fothergill

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