Halak, Basel (2016) The effects of BTI aging on the susceptibility of on-chip communication schemes to soft errors in nano-scale CMOS technologies. In, Thus Asynchronous World. Newcastle upon Tyne, GB. Newcastle University, pp. 150-166. (In Press)
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Book Section
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Accepted/In Press date: 19 July 2016
Organisations:
EEE
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Local EPrints ID: 398620
URI: http://eprints.soton.ac.uk/id/eprint/398620
PURE UUID: bc22896b-8ca5-429f-93d6-879e9a60e15d
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Date deposited: 28 Jul 2016 09:54
Last modified: 15 Mar 2024 03:39
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Author:
Basel Halak
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