Enhancing parametric sensitivity in electrically coupled MEMS resonators
Enhancing parametric sensitivity in electrically coupled MEMS resonators
We use vibration localization as a sensitive means of detecting small perturbations in stiffness in a pair of weakly coupled micromechanical resonators. For the first time, the variation in the eigenstates is studied by electrostatically coupling nearly identical resonators to allow for stronger localization of vibrational energy due to perturbations in stiffness. Eigenstate variations that are orders of magnitude greater than corresponding shifts in resonant frequency for an induced stiffness perturbation are experimentally demonstrated. Such high, voltage-tunable parametric sensitivities together with the added advantage of intrinsic common mode rejection pave the way to a new paradigm of mechanical sensing.
2350-2353
Thiruvenkatanathan, Pradyumna
42613b52-d83d-4fa9-bc40-337201dfa2a0
Yan, Jize
786dc090-843b-435d-adbe-1d35e8fc5828
Lee, Joshua
16c56789-d260-4a0f-a880-009135faf1d9
Seshia, A Ashwin
674d2acc-6942-432d-9f32-e0d8fffcd36e
Thiruvenkatanathan, Pradyumna
42613b52-d83d-4fa9-bc40-337201dfa2a0
Yan, Jize
786dc090-843b-435d-adbe-1d35e8fc5828
Lee, Joshua
16c56789-d260-4a0f-a880-009135faf1d9
Seshia, A Ashwin
674d2acc-6942-432d-9f32-e0d8fffcd36e
Thiruvenkatanathan, Pradyumna, Yan, Jize, Lee, Joshua and Seshia, A Ashwin
(2009)
Enhancing parametric sensitivity in electrically coupled MEMS resonators.
Transducers 2009 - 2009 International Solid-State Sensors, Actuators and Microsystems Conference, Denver, United States.
21 - 25 Jun 2009.
.
(doi:10.1109/SENSOR.2009.5285444).
Record type:
Conference or Workshop Item
(Paper)
Abstract
We use vibration localization as a sensitive means of detecting small perturbations in stiffness in a pair of weakly coupled micromechanical resonators. For the first time, the variation in the eigenstates is studied by electrostatically coupling nearly identical resonators to allow for stronger localization of vibrational energy due to perturbations in stiffness. Eigenstate variations that are orders of magnitude greater than corresponding shifts in resonant frequency for an induced stiffness perturbation are experimentally demonstrated. Such high, voltage-tunable parametric sensitivities together with the added advantage of intrinsic common mode rejection pave the way to a new paradigm of mechanical sensing.
Text
[18] trans 09 prad.pdf
- Other
More information
e-pub ahead of print date: 2009
Venue - Dates:
Transducers 2009 - 2009 International Solid-State Sensors, Actuators and Microsystems Conference, Denver, United States, 2009-06-21 - 2009-06-25
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 398794
URI: http://eprints.soton.ac.uk/id/eprint/398794
PURE UUID: b4e15717-3445-43c4-a7e5-b2d08b43ec89
Catalogue record
Date deposited: 03 Aug 2016 10:35
Last modified: 15 Mar 2024 03:53
Export record
Altmetrics
Contributors
Author:
Pradyumna Thiruvenkatanathan
Author:
Joshua Lee
Author:
A Ashwin Seshia
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics