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The impacts of degassing on space charge characteristics and DC conductivity in semicon-bonded XLPE For HVDC cable applications

The impacts of degassing on space charge characteristics and DC conductivity in semicon-bonded XLPE For HVDC cable applications
The impacts of degassing on space charge characteristics and DC conductivity in semicon-bonded XLPE For HVDC cable applications
High voltage direct current (HVDC) cables are one of the key components for the HVDC power transmission system. HVDC cables for higher voltage level, larger power capacity and higher reliability are still desired for the power industry as part of a global power strategy. One of the major concerns related to HVDC applications is the presence of space charge within the dielectrics, which distorts the electric field distribution and contributes to accelerated ageing and consequent failure of the cable insulation. The byproducts generated from the crosslinking process during the manufacture of XLPE insulation for HVDC cable are one of the major sources of hetero-charge formation in dielectrics. Therefore, degassing is widely applied in cable manufacture for the removal of such crosslinking byproducts. In this paper, composite XLPE samples were produced that include two layers of semiconductive polymer (semicon), which are thermally bonded on the top and bottom of the XLPE insulation, to mimic a real cable manufacturing process. The samples were degassed under vacuum and elevated temperature for 1, 3 and 6 days and their space charge characteristics and conductivities were then measured at an applied field of 40 kV/mm. The influence of the degassing period and the semicon material formulation on space charge formation and distribution in the system are discussed and the findings are compared with undegassed samples.
97-100
Hao, M.
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Fazal, A.
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Vaughan, A.
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Chen, G.
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Zhou, Y.
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Zhang, C.
fa728450-fee5-44d4-ac66-25b57611c58d
Hao, M.
fb7006e0-07c0-46f5-9279-e30a7d3bd614
Fazal, A.
926d3b48-d11b-45b1-b922-5c2e8e3ba5fd
Vaughan, A.
6d813b66-17f9-4864-9763-25a6d659d8a3
Chen, G.
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Zhou, Y.
a5398d19-1c29-40ca-9c74-72a1fa2db5e6
Zhang, C.
fa728450-fee5-44d4-ac66-25b57611c58d

Hao, M., Fazal, A., Vaughan, A., Chen, G., Zhou, Y. and Zhang, C. (2016) The impacts of degassing on space charge characteristics and DC conductivity in semicon-bonded XLPE For HVDC cable applications. IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP2016), Canada. 16 - 19 Oct 2016. pp. 97-100 . (doi:10.1109/CEIDP.2016.7785533).

Record type: Conference or Workshop Item (Poster)

Abstract

High voltage direct current (HVDC) cables are one of the key components for the HVDC power transmission system. HVDC cables for higher voltage level, larger power capacity and higher reliability are still desired for the power industry as part of a global power strategy. One of the major concerns related to HVDC applications is the presence of space charge within the dielectrics, which distorts the electric field distribution and contributes to accelerated ageing and consequent failure of the cable insulation. The byproducts generated from the crosslinking process during the manufacture of XLPE insulation for HVDC cable are one of the major sources of hetero-charge formation in dielectrics. Therefore, degassing is widely applied in cable manufacture for the removal of such crosslinking byproducts. In this paper, composite XLPE samples were produced that include two layers of semiconductive polymer (semicon), which are thermally bonded on the top and bottom of the XLPE insulation, to mimic a real cable manufacturing process. The samples were degassed under vacuum and elevated temperature for 1, 3 and 6 days and their space charge characteristics and conductivities were then measured at an applied field of 40 kV/mm. The influence of the degassing period and the semicon material formulation on space charge formation and distribution in the system are discussed and the findings are compared with undegassed samples.

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A-Fazal CEIDP2016 (Final version).pdf - Accepted Manuscript
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Accepted/In Press date: September 2016
Published date: 19 December 2016
Venue - Dates: IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP2016), Canada, 2016-10-16 - 2016-10-19
Organisations: EEE

Identifiers

Local EPrints ID: 402443
URI: http://eprints.soton.ac.uk/id/eprint/402443
PURE UUID: a6b00219-4694-420a-b9ae-318b8313f537
ORCID for A. Vaughan: ORCID iD orcid.org/0000-0002-0535-513X

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Date deposited: 09 Nov 2016 15:24
Last modified: 17 Dec 2019 01:52

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Contributors

Author: M. Hao
Author: A. Fazal
Author: A. Vaughan ORCID iD
Author: G. Chen
Author: Y. Zhou
Author: C. Zhang

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