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Dataset: RDF and TID simulation of PDSOI 45nm MOSFET

Dataset: RDF and TID simulation of PDSOI 45nm MOSFET
Dataset: RDF and TID simulation of PDSOI 45nm MOSFET
Dataset supporting: Chatzikyriakou, Eleni, Redman-White, William and De Groot, Kees (2016) Total Ionizing Dose, Random Dopant Fluctuations and its combined effect in the 45 nm PDSOI node. Microelectronics Reliability.
University of Southampton
Chatzikyriakou, Eleni
3898b429-c7ef-42a3-8fca-d6e8c85b27fb
De Groot, Cornelis
92cd2e02-fcc4-43da-8816-c86f966be90c
Chatzikyriakou, Eleni
3898b429-c7ef-42a3-8fca-d6e8c85b27fb
De Groot, Cornelis
92cd2e02-fcc4-43da-8816-c86f966be90c

Chatzikyriakou, Eleni and De Groot, Cornelis (2016) Dataset: RDF and TID simulation of PDSOI 45nm MOSFET. University of Southampton doi:10.5258/SOTON/403024 [Dataset]

Record type: Dataset

Abstract

Dataset supporting: Chatzikyriakou, Eleni, Redman-White, William and De Groot, Kees (2016) Total Ionizing Dose, Random Dopant Fluctuations and its combined effect in the 45 nm PDSOI node. Microelectronics Reliability.

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45nm_2D_Radiation.gzp - Dataset
Available under License Creative Commons Attribution.
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45nm_35e17_Sano_NotNit.gzp - Dataset
Available under License Creative Commons Attribution.
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45nm_IFM_NotNit.gzp - Dataset
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README.pdf - Text
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License - Text
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More information

Published date: 2016
Organisations: Electronics & Computer Science, Nanoelectronics and Nanotechnology
Projects:
Degradation mechanisms in semiconductor logic
Funded by: UNSPECIFIED (1304067)
1 October 2012 to 30 September 2015

Identifiers

Local EPrints ID: 403024
URI: http://eprints.soton.ac.uk/id/eprint/403024
PURE UUID: c576bfd0-e846-408a-9094-70b468c885de
ORCID for Eleni Chatzikyriakou: ORCID iD orcid.org/0000-0002-5624-3701
ORCID for Cornelis De Groot: ORCID iD orcid.org/0000-0002-3850-7101

Catalogue record

Date deposited: 23 Nov 2016 16:31
Last modified: 06 Oct 2018 00:36

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Contributors

Creator: Eleni Chatzikyriakou ORCID iD

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