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Transport properties of single MgB2 filaments extracted from multifilamentary conductors

Transport properties of single MgB2 filaments extracted from multifilamentary conductors
Transport properties of single MgB2 filaments extracted from multifilamentary conductors
Using an electrochemical bath copper and nickel metals and alloys are removed in multifilamentary MgB2 conductors to leave single MgB2 filaments surrounded by a Nb sheath. Starting from a 0.55 mm 36 filament diameter conductor, the etched filaments are 60 microns in diameter. Seven wires were characterized by transport critical current measurement, and one investigated further by resistivity when progressively etched. Their radial location in the original multifilamentary wire structure is then used to explore if the critical current is sensitive to the deformation process. The average critical current of the outer layer of filaments is 35% higher than the inner layers. The average filament critical current was 32 A which is within 10 % of the 36 filament wire critical current per filament when adjusted for self field.
1051-8223
1-5
Young, Edward
d3a881b0-a564-41f5-9843-34ae86da360f
Zhang, Qingbo
d9e5bf57-ea39-42e9-8056-eb2be5845e3f
Yang, Yifeng
4cac858a-e0c0-4174-a839-05ca394fc51f
Young, Edward
d3a881b0-a564-41f5-9843-34ae86da360f
Zhang, Qingbo
d9e5bf57-ea39-42e9-8056-eb2be5845e3f
Yang, Yifeng
4cac858a-e0c0-4174-a839-05ca394fc51f

Young, Edward, Zhang, Qingbo and Yang, Yifeng (2017) Transport properties of single MgB2 filaments extracted from multifilamentary conductors. IEEE Transactions on Applied Superconductivity, 27 (4), 1-5. (doi:10.1109/TASC.2016.2645129).

Record type: Article

Abstract

Using an electrochemical bath copper and nickel metals and alloys are removed in multifilamentary MgB2 conductors to leave single MgB2 filaments surrounded by a Nb sheath. Starting from a 0.55 mm 36 filament diameter conductor, the etched filaments are 60 microns in diameter. Seven wires were characterized by transport critical current measurement, and one investigated further by resistivity when progressively etched. Their radial location in the original multifilamentary wire structure is then used to explore if the critical current is sensitive to the deformation process. The average critical current of the outer layer of filaments is 35% higher than the inner layers. The average filament critical current was 32 A which is within 10 % of the 36 filament wire critical current per filament when adjusted for self field.

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Accepted/In Press date: 22 December 2016
e-pub ahead of print date: 23 December 2016
Published date: June 2017
Organisations: Engineering Science Unit

Identifiers

Local EPrints ID: 405052
URI: http://eprints.soton.ac.uk/id/eprint/405052
ISSN: 1051-8223
PURE UUID: 479659dd-172f-4bc2-9e90-a04a2d0e8daa
ORCID for Yifeng Yang: ORCID iD orcid.org/0000-0002-3874-6735

Catalogue record

Date deposited: 26 Jan 2017 13:18
Last modified: 16 Mar 2024 02:44

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Contributors

Author: Edward Young
Author: Qingbo Zhang
Author: Yifeng Yang ORCID iD

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