The University of Southampton
University of Southampton Institutional Repository

SRAM-PUF Based on Selective Power-Up and Non-Destructive Scheme

SRAM-PUF Based on Selective Power-Up and Non-Destructive Scheme
SRAM-PUF Based on Selective Power-Up and Non-Destructive Scheme
Abstract. Research in hardware security, particularly on Physical Unclonable Functions (PUF) has attracted a lot of attention in recent years. PUFs provide primitives for implementing encryption/decryption and device fingerprinting. Though a wide range of solutions exists for PUF-based CMOS devices, the most investigated solutions today for weak PUF implementation are based on the use of random start-up values of SRAM, which offers the advantage of reusing memories that already exist in many designs. However, the start-up value availability is compromised during memory write access which causes a limitation in using SRAM as both memory and PUF. Although using a dedicated SRAM as PUF could overcome the problem, it comes with high extra overhead. In this work, we propose a new scheme called ‘selective power-up and non-destructive’ scheme to enable SRAM as memory and PUF. A case study of generating a 128-bit key shows that the area overhead of proposed scheme is approximately 12.5_ smaller than for a dedicated SRAM-PUF
Mispan, Mohd
568c91c3-c200-441c-887b-8f299635b94e
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33
Mispan, Mohd
568c91c3-c200-441c-887b-8f299635b94e
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33

Mispan, Mohd, Zwolinski, Mark and Halak, Basel (2016) SRAM-PUF Based on Selective Power-Up and Non-Destructive Scheme At 17th International Workshop on Microprocessor/SoC Test and Verification (MTV 2016), United States.

Record type: Conference or Workshop Item (Paper)

Abstract

Abstract. Research in hardware security, particularly on Physical Unclonable Functions (PUF) has attracted a lot of attention in recent years. PUFs provide primitives for implementing encryption/decryption and device fingerprinting. Though a wide range of solutions exists for PUF-based CMOS devices, the most investigated solutions today for weak PUF implementation are based on the use of random start-up values of SRAM, which offers the advantage of reusing memories that already exist in many designs. However, the start-up value availability is compromised during memory write access which causes a limitation in using SRAM as both memory and PUF. Although using a dedicated SRAM as PUF could overcome the problem, it comes with high extra overhead. In this work, we propose a new scheme called ‘selective power-up and non-destructive’ scheme to enable SRAM as memory and PUF. A case study of generating a 128-bit key shows that the area overhead of proposed scheme is approximately 12.5_ smaller than for a dedicated SRAM-PUF

PDF SRAM.pdf - Accepted Manuscript
Available under License Other.
Download (9kB)

More information

Accepted/In Press date: 31 December 2016
Venue - Dates: 17th International Workshop on Microprocessor/SoC Test and Verification (MTV 2016), United States, 2016-12-31
Organisations: Electronics & Computer Science

Identifiers

Local EPrints ID: 405597
URI: http://eprints.soton.ac.uk/id/eprint/405597
PURE UUID: ade5f176-0321-4db7-a9b3-2da2d70f3ff7
ORCID for Mark Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 08 Feb 2017 11:29
Last modified: 17 Jul 2017 17:21

Export record

Contributors

Author: Mohd Mispan
Author: Mark Zwolinski ORCID iD
Author: Basel Halak

University divisions

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of http://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×