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SRAM-PUF Based on Selective Power-Up and Non-Destructive Scheme

SRAM-PUF Based on Selective Power-Up and Non-Destructive Scheme
SRAM-PUF Based on Selective Power-Up and Non-Destructive Scheme
Research in hardware security, particularly on Physical Unclonable Functions (PUF) has attracted a lot of attention in recent years. PUFs provide primitives for implementing encryption/decryption and device fingerprinting. Though a wide range of solutions exists for PUF-based CMOS devices, the most investigated solutions today for weak PUF implementation are based on the use of random start-up values of SRAM, which offers the advantage of reusing memories that already exist in many designs. However, the start-up value availability is compromised during memory write access which causes a limitation in using SRAM as both memory and PUF. Although using a dedicated SRAM as PUF could overcome the problem, it comes with high extra overhead. In this work, we propose a new scheme called ‘selective power-up and non-destructive’ scheme to enable SRAM as memory and PUF. A case study of generating a 128-bit key shows that the area overhead of proposed scheme is approximately 12.5_ smaller than for a dedicated SRAM-PUF.
Mispan, Mohd
568c91c3-c200-441c-887b-8f299635b94e
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33
Mispan, Mohd
568c91c3-c200-441c-887b-8f299635b94e
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33

Mispan, Mohd, Zwolinski, Mark and Halak, Basel (2016) SRAM-PUF Based on Selective Power-Up and Non-Destructive Scheme. 17th International Workshop on Microprocessor/SoC Test and Verification (MTV 2016), United States, United States. (In Press)

Record type: Conference or Workshop Item (Paper)

Abstract

Research in hardware security, particularly on Physical Unclonable Functions (PUF) has attracted a lot of attention in recent years. PUFs provide primitives for implementing encryption/decryption and device fingerprinting. Though a wide range of solutions exists for PUF-based CMOS devices, the most investigated solutions today for weak PUF implementation are based on the use of random start-up values of SRAM, which offers the advantage of reusing memories that already exist in many designs. However, the start-up value availability is compromised during memory write access which causes a limitation in using SRAM as both memory and PUF. Although using a dedicated SRAM as PUF could overcome the problem, it comes with high extra overhead. In this work, we propose a new scheme called ‘selective power-up and non-destructive’ scheme to enable SRAM as memory and PUF. A case study of generating a 128-bit key shows that the area overhead of proposed scheme is approximately 12.5_ smaller than for a dedicated SRAM-PUF.

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More information

Accepted/In Press date: 31 December 2016
Venue - Dates: 17th International Workshop on Microprocessor/SoC Test and Verification (MTV 2016), United States, United States, 2016-12-31
Organisations: Electronics & Computer Science

Identifiers

Local EPrints ID: 405597
URI: http://eprints.soton.ac.uk/id/eprint/405597
PURE UUID: ade5f176-0321-4db7-a9b3-2da2d70f3ff7
ORCID for Mark Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X
ORCID for Basel Halak: ORCID iD orcid.org/0000-0003-3470-7226

Catalogue record

Date deposited: 08 Feb 2017 11:29
Last modified: 16 Mar 2024 04:07

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Contributors

Author: Mohd Mispan
Author: Mark Zwolinski ORCID iD
Author: Basel Halak ORCID iD

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