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Coherent diffractive imaging with a laboratory-scale, gas-discharge plasma extreme ultraviolet light source

Coherent diffractive imaging with a laboratory-scale, gas-discharge plasma extreme ultraviolet light source
Coherent diffractive imaging with a laboratory-scale, gas-discharge plasma extreme ultraviolet light source
Coherent diffractive imaging (CDI) and related techniques enable a new type of diffraction-limited high resolution microscopy and have been widely used in the extreme ultraviolet (EUV) and X-ray communities. In this experiment, we demonstrate CDI using a compact gas-discharge EUV light source with a wavelength of 17.3 nm (oxygen VI emission). Our image reconstruction method accounts for the partial spatial coherence of the radiation using a deconvolution technique. Our results are promising for future laboratory-scale CDI applications, including mask inspection for EUV lithography and EUV metrology.

These proceedings comprise invited and contributed papers presented at the 14th International Conference on X-Ray Lasers (ICXRL 2014). This conference is part of a continuing series dedicated to recent developments and applications of x-ray lasers and other coherent x-ray sources with attention to supporting technologies and instrumentation. New results in the generation of intense, coherent x-rays and progress toward practical devices and their applications in numerous fields are reported. Areas of research in plasma-based x-ray lasers, 4th generation accelerator-based sources and higher harmonic generation, and other x-ray generation schemes are covered. The scope of ICXRL 2014 included, but was not limited to: Laser-pumped X-ray lasers Discharge excitation and other X-ray laser pumping methods Injection/seeding of X-ray amplifiers New lasing transitions and novel X-ray laser schemes High Harmonic sources-Free-electron laser generation in the XUV and X-ray range Novel schemes for coherent XUV and X-ray generation XUV and X-ray optics and metrology-Driving laser technology Theory and modeling of X-ray gain medium and beam characteristics Applications of high brightness and ultrashort X-ray sources.
275-280
Bussman, Jan
700f2ddc-cb81-4a25-a138-5c372138733e
Odstrčil, Michal
b297d3ec-ed42-4709-9f90-7af79d0644c7
Bresenitz, R.
737a9c51-52f5-470d-a428-5f1cb383f3a6
Rudolf, D.
f73b65ea-7f94-4608-932b-29e2f734648b
Miao, Jianwei
ad0364fc-5612-4050-b6ea-eedbb7b98f72
Brocklesby, William
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
Juschkin, Larissa
5c7e1507-20c3-45a7-826a-82f1e31fd146
Bussman, Jan
700f2ddc-cb81-4a25-a138-5c372138733e
Odstrčil, Michal
b297d3ec-ed42-4709-9f90-7af79d0644c7
Bresenitz, R.
737a9c51-52f5-470d-a428-5f1cb383f3a6
Rudolf, D.
f73b65ea-7f94-4608-932b-29e2f734648b
Miao, Jianwei
ad0364fc-5612-4050-b6ea-eedbb7b98f72
Brocklesby, William
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
Juschkin, Larissa
5c7e1507-20c3-45a7-826a-82f1e31fd146

Bussman, Jan, Odstrčil, Michal, Bresenitz, R., Rudolf, D., Miao, Jianwei, Brocklesby, William and Juschkin, Larissa (2016) Coherent diffractive imaging with a laboratory-scale, gas-discharge plasma extreme ultraviolet light source. 14th International Conference on X-Ray Lasers, Colorado State University, Fort Collins, United States. 26 - 30 May 2014. pp. 275-280 . (doi:10.1007/978-3-319-19521-6_36).

Record type: Conference or Workshop Item (Paper)

Abstract

Coherent diffractive imaging (CDI) and related techniques enable a new type of diffraction-limited high resolution microscopy and have been widely used in the extreme ultraviolet (EUV) and X-ray communities. In this experiment, we demonstrate CDI using a compact gas-discharge EUV light source with a wavelength of 17.3 nm (oxygen VI emission). Our image reconstruction method accounts for the partial spatial coherence of the radiation using a deconvolution technique. Our results are promising for future laboratory-scale CDI applications, including mask inspection for EUV lithography and EUV metrology.

These proceedings comprise invited and contributed papers presented at the 14th International Conference on X-Ray Lasers (ICXRL 2014). This conference is part of a continuing series dedicated to recent developments and applications of x-ray lasers and other coherent x-ray sources with attention to supporting technologies and instrumentation. New results in the generation of intense, coherent x-rays and progress toward practical devices and their applications in numerous fields are reported. Areas of research in plasma-based x-ray lasers, 4th generation accelerator-based sources and higher harmonic generation, and other x-ray generation schemes are covered. The scope of ICXRL 2014 included, but was not limited to: Laser-pumped X-ray lasers Discharge excitation and other X-ray laser pumping methods Injection/seeding of X-ray amplifiers New lasing transitions and novel X-ray laser schemes High Harmonic sources-Free-electron laser generation in the XUV and X-ray range Novel schemes for coherent XUV and X-ray generation XUV and X-ray optics and metrology-Driving laser technology Theory and modeling of X-ray gain medium and beam characteristics Applications of high brightness and ultrashort X-ray sources.

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More information

e-pub ahead of print date: 20 September 2015
Published date: 2016
Venue - Dates: 14th International Conference on X-Ray Lasers, Colorado State University, Fort Collins, United States, 2014-05-26 - 2014-05-30
Organisations: Optoelectronics Research Centre

Identifiers

Local EPrints ID: 406664
URI: http://eprints.soton.ac.uk/id/eprint/406664
PURE UUID: 12a25393-37bf-4692-8543-fa2acf1e87b9
ORCID for William Brocklesby: ORCID iD orcid.org/0000-0002-2123-6712

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Date deposited: 18 Mar 2017 02:28
Last modified: 16 Mar 2024 02:39

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Contributors

Author: Jan Bussman
Author: Michal Odstrčil
Author: R. Bresenitz
Author: D. Rudolf
Author: Jianwei Miao
Author: Larissa Juschkin

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