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The lamellar thickness of melt crystallized isotactic polystyrene as determined by atomic force microscopy

The lamellar thickness of melt crystallized isotactic polystyrene as determined by atomic force microscopy
The lamellar thickness of melt crystallized isotactic polystyrene as determined by atomic force microscopy
Atomic force microscopy has been used to investigate the morphology of isotactic polystyrene lamellae growth from the melt in very thin films (∼ 50 nm in thickness). It is shown that atomic force microscopy can elucidate the crystal morphology and provide quantitative measurements of the step height (between successive crystal layers of a spiral overgrowth terrace) corresponding to the long spacing, provided suitable procedures are employed.
atomic force microscopy, permanganic etching, lamellar thickness
0032-3861
5529-5532
Sutton, S.J.
571c7136-1eb6-44e1-8979-ca0829469a6b
Izumi, K.
eeac0428-c735-4551-be68-dc4675e36fb0
Miyaji, H.
d415729c-c2b0-4db2-9057-ad2d72fed11c
Fukao, K.
e0a0f551-2235-4092-af28-bbc050d7377b
Miyamoto, Y.
1bf2a4ae-9d29-4665-9f17-0e5004c7211e
Sutton, S.J.
571c7136-1eb6-44e1-8979-ca0829469a6b
Izumi, K.
eeac0428-c735-4551-be68-dc4675e36fb0
Miyaji, H.
d415729c-c2b0-4db2-9057-ad2d72fed11c
Fukao, K.
e0a0f551-2235-4092-af28-bbc050d7377b
Miyamoto, Y.
1bf2a4ae-9d29-4665-9f17-0e5004c7211e

Sutton, S.J., Izumi, K., Miyaji, H., Fukao, K. and Miyamoto, Y. (1996) The lamellar thickness of melt crystallized isotactic polystyrene as determined by atomic force microscopy. Polymer, 37 (24), 5529-5532. (doi:10.1016/S0032-3861(96)00435-1).

Record type: Article

Abstract

Atomic force microscopy has been used to investigate the morphology of isotactic polystyrene lamellae growth from the melt in very thin films (∼ 50 nm in thickness). It is shown that atomic force microscopy can elucidate the crystal morphology and provide quantitative measurements of the step height (between successive crystal layers of a spiral overgrowth terrace) corresponding to the long spacing, provided suitable procedures are employed.

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More information

Published date: November 1996
Keywords: atomic force microscopy, permanganic etching, lamellar thickness
Organisations: EEE

Identifiers

Local EPrints ID: 408049
URI: https://eprints.soton.ac.uk/id/eprint/408049
ISSN: 0032-3861
PURE UUID: c9919d04-8c6b-42ac-90db-458b0fdb39f4

Catalogue record

Date deposited: 10 May 2017 01:06
Last modified: 13 Mar 2019 19:58

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