Combined atomic force microscopy and photoluminescence imaging to select single InAs/GaAs quantum dots for quantum photonic devices
Combined atomic force microscopy and photoluminescence imaging to select single InAs/GaAs quantum dots for quantum photonic devices
Sapienza, Luca
a2e0cf6c-1f22-4a5a-87a2-ffab0e24e6ac
2017
Sapienza, Luca
a2e0cf6c-1f22-4a5a-87a2-ffab0e24e6ac
Sapienza, Luca
(2017)
Combined atomic force microscopy and photoluminescence imaging to select single InAs/GaAs quantum dots for quantum photonic devices.
Scientific Reports.
(doi:10.1038/s41598-017-06566-5).
Text
AFM_PL_revised_manuscript_June5
- Accepted Manuscript
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Accepted/In Press date: 14 June 2017
e-pub ahead of print date: 24 July 2017
Published date: 2017
Organisations:
Quantum, Light & Matter Group
Identifiers
Local EPrints ID: 411334
URI: http://eprints.soton.ac.uk/id/eprint/411334
ISSN: 2045-2322
PURE UUID: 651f4343-1d69-4c3b-b718-353a5a149eee
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Date deposited: 19 Jun 2017 16:30
Last modified: 06 Oct 2020 16:42
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