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Ion implantation in silicon to facilitate testing of photonic circuits

Ion implantation in silicon to facilitate testing of photonic circuits
Ion implantation in silicon to facilitate testing of photonic circuits
1010709
Reed, Graham
ca08dd60-c072-4d7d-b254-75714d570139
Milošević, Milan
b28da945-84a5-4317-8896-6d9ea6a69589
Chen, Xia
64f6ab92-ca11-4489-8c03-52bc986209ae
Cao, Wei
6194b5dd-d4e9-40d0-b5fb-b264d72fe594
Wang, Hong
dfd0ec4f-682a-4596-a0d1-171313cc5733
Khokhar, Ali
2eedd1cc-8ac5-4f8e-be25-930bd3eae396
Thomson, David
17c1626c-2422-42c6-98e0-586ae220bcda
Reed, Graham
ca08dd60-c072-4d7d-b254-75714d570139
Milošević, Milan
b28da945-84a5-4317-8896-6d9ea6a69589
Chen, Xia
64f6ab92-ca11-4489-8c03-52bc986209ae
Cao, Wei
6194b5dd-d4e9-40d0-b5fb-b264d72fe594
Wang, Hong
dfd0ec4f-682a-4596-a0d1-171313cc5733
Khokhar, Ali
2eedd1cc-8ac5-4f8e-be25-930bd3eae396
Thomson, David
17c1626c-2422-42c6-98e0-586ae220bcda

Reed, Graham, Milošević, Milan, Chen, Xia, Cao, Wei, Wang, Hong, Khokhar, Ali and Thomson, David (2017) Ion implantation in silicon to facilitate testing of photonic circuits. p. 1010709 . (doi:10.1117/12.2252770).

Record type: Conference or Workshop Item (Other)
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Ion implantation in silicon to facilitate testing of photonic circuits - Accepted Manuscript
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Published date: 20 February 2017
Additional Information: AM now added.

Identifiers

Local EPrints ID: 412148
URI: https://eprints.soton.ac.uk/id/eprint/412148
PURE UUID: 169dde5c-bc47-45f0-8956-6a1f4759af3c
ORCID for Xia Chen: ORCID iD orcid.org/0000-0002-0994-5401
ORCID for Wei Cao: ORCID iD orcid.org/0000-0003-1431-7060

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Date deposited: 11 Jul 2017 16:32
Last modified: 30 Nov 2019 01:32

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Contributors

Author: Graham Reed
Author: Xia Chen ORCID iD
Author: Wei Cao ORCID iD
Author: Hong Wang
Author: Ali Khokhar
Author: David Thomson

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