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Low cost error monitoring for improved maintainability of IoT applications

Low cost error monitoring for improved maintainability of IoT applications
Low cost error monitoring for improved maintainability of IoT applications
Electronic systems with power-constrained embedded devices are used for a variety of IoT applications, such as geomonitoring, parking sensors and surveillance. Such applications may tolerate few errors. However, with the increasing occurrence of faults in-the-field, devices that exhibit systematic erroneous behaviour must be eventually identified and replaced. In this paper, we propose a novel low cost error monitoring technique to assist the maintainability planning of low power IoT applications by ranking devices based on the systematic erroneous behaviour they exhibit. Small on-chip monitors are used to collect the signal probability information at the outputs of each device which is then transmitted to the system software via the communications channel of the system to rank them accordingly. To evaluate the error monitoring capabilities of the proposed technique, we injected multiple bit-flips and stuck-at faults on a set of the EPFL and the ISCAS benchmarks. Results demonstrate an average error coverage of 84.4% and 73.1% of errors induced by bit-flips and stuck-at faults, respectively, with an average area cost of 1.52%. A maintainability planning simulation shows that the proposed technique achieves a reduction of 26x to 263x in area cost and static power, and consumes over 625x less power for communications when compared against duplication and comparison.
Gutierrez Alcala, Mauricio, Daniel
29838e60-f993-48e7-8133-0d0ff32129fa
Tenentes, Vasileios
1bff9ebc-9186-438b-850e-6c738994fa39
Kazmierski, Tomasz
a97d7958-40c3-413f-924d-84545216092a
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Gutierrez Alcala, Mauricio, Daniel
29838e60-f993-48e7-8133-0d0ff32129fa
Tenentes, Vasileios
1bff9ebc-9186-438b-850e-6c738994fa39
Kazmierski, Tomasz
a97d7958-40c3-413f-924d-84545216092a
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f

Gutierrez Alcala, Mauricio, Daniel, Tenentes, Vasileios, Kazmierski, Tomasz and Rossi, Daniele (2017) Low cost error monitoring for improved maintainability of IoT applications. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. 23 - 25 Oct 2017. 6 pp . (In Press)

Record type: Conference or Workshop Item (Paper)

Abstract

Electronic systems with power-constrained embedded devices are used for a variety of IoT applications, such as geomonitoring, parking sensors and surveillance. Such applications may tolerate few errors. However, with the increasing occurrence of faults in-the-field, devices that exhibit systematic erroneous behaviour must be eventually identified and replaced. In this paper, we propose a novel low cost error monitoring technique to assist the maintainability planning of low power IoT applications by ranking devices based on the systematic erroneous behaviour they exhibit. Small on-chip monitors are used to collect the signal probability information at the outputs of each device which is then transmitted to the system software via the communications channel of the system to rank them accordingly. To evaluate the error monitoring capabilities of the proposed technique, we injected multiple bit-flips and stuck-at faults on a set of the EPFL and the ISCAS benchmarks. Results demonstrate an average error coverage of 84.4% and 73.1% of errors induced by bit-flips and stuck-at faults, respectively, with an average area cost of 1.52%. A maintainability planning simulation shows that the proposed technique achieves a reduction of 26x to 263x in area cost and static power, and consumes over 625x less power for communications when compared against duplication and comparison.

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DFT_2017_IoT - Accepted Manuscript
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More information

Accepted/In Press date: 7 July 2017
Venue - Dates: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2017-10-23 - 2017-10-25

Identifiers

Local EPrints ID: 413033
URI: http://eprints.soton.ac.uk/id/eprint/413033
PURE UUID: 9de5bcd0-573a-4f38-be1f-a38314bc6862

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Date deposited: 14 Aug 2017 16:30
Last modified: 16 Mar 2024 05:38

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Contributors

Author: Mauricio, Daniel Gutierrez Alcala
Author: Vasileios Tenentes
Author: Tomasz Kazmierski
Author: Daniele Rossi

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