Sapienza, L., Liu, J., Song, J.D., Falt, S., Wegscheider, W., Badolato, A. and Srinivasan, K. (2017) Combined atomic force microscopy and photoluminescence imaging to increase the yield of quantum dot photonic devices. Frontiers in Optics, , Washington DC, United States. 17 - 21 Sep 2017. 2 pp . (In Press)
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Accepted/In Press date: June 2017
Venue - Dates:
Frontiers in Optics, , Washington DC, United States, 2017-09-17 - 2017-09-21
Identifiers
Local EPrints ID: 413043
URI: http://eprints.soton.ac.uk/id/eprint/413043
PURE UUID: 40cef8f0-82ec-4c06-89dd-92be0ef44e3d
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Date deposited: 14 Aug 2017 16:30
Last modified: 16 Mar 2024 05:37
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Contributors
Author:
L. Sapienza
Author:
J. Liu
Author:
J.D. Song
Author:
S. Falt
Author:
W. Wegscheider
Author:
A. Badolato
Author:
K. Srinivasan
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