Tsuchiya, Yoshishige, Harada, Naoaki, Giotis, Christos, Lamb, Joshua, Arab Hassani, Faezeh, Shikida, Mitsuhiro, Dupré, Cecilia, Ollier, Eric, Bartsch, Sebastian, Mihai Ionescu, Adrian and Mizuta, H. (2017) RF characterisation of CMOS-compatible silicon-on-insulator nanoelectromechanical resonators. In 43rd International Conference on Micro and Nanoengineering (MNE2017), Braga, Portugal. Sep. 18-22 2017. (In Press)
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MNE2017Abstract_Yoshi_Final
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Accepted/In Press date: 29 June 2017
Venue - Dates:
43rd International Conference on Micro and Nanoengineering, , Braga, Portugal, 2017-09-18 - 2017-09-22
Identifiers
Local EPrints ID: 413831
URI: http://eprints.soton.ac.uk/id/eprint/413831
PURE UUID: 713d468c-0295-42b0-b8cb-c2f23b94b5e7
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Date deposited: 07 Sep 2017 16:32
Last modified: 16 Mar 2024 05:42
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Contributors
Author:
Yoshishige Tsuchiya
Author:
Naoaki Harada
Author:
Christos Giotis
Author:
Joshua Lamb
Author:
Faezeh Arab Hassani
Author:
Mitsuhiro Shikida
Author:
Cecilia Dupré
Author:
Eric Ollier
Author:
Sebastian Bartsch
Author:
Adrian Mihai Ionescu
Author:
H. Mizuta
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