The University of Southampton
University of Southampton Institutional Repository

Tip-Enhanced Raman characterization of He-ion-irradiated CVD graphene channels

Tip-Enhanced Raman characterization of He-ion-irradiated CVD graphene channels
Tip-Enhanced Raman characterization of He-ion-irradiated CVD graphene channels
Graphene has been attracting significant attention for various types of device applications due to its unique properties emerging from the atomically-thin 2-dimentional layer. In particular for micro- and nanoscale device applications, how to control defects in graphene and how to observe the effects of defects are some of the most important issues to understand mechanisms behind device operation and to gain more flexibility in designing device structures [1,2]. While oxygen plasma, ion bombardment and focused ion beam (FIB) have been employed to introduce defects [1-3], helium ion irradiation via Helium Ion Microscope (HIM) is an attractive method because of excellent spatial resolution and position controllability. Effects of He ion irradiation on graphene have been investigated via Raman spectroscopy [4] and transport properties [5]. However to study the edge and boundary between the irradiated and non-irradiated regions, advanced tools with higher spatial resolution would be useful. In this work we have applied Tip-Enhanced Raman Spectroscopy (TERS) for He-ion-irradiated graphene for the first time to study effects of irradiation in details, in particular focusing on the boundary of the irradiated regions.
Zelai, Taharh
dae04f28-259f-4b97-9f47-dadf2a663b51
Iwasaki, Takuya
b9de92ae-a490-4cb3-8e39-d4ad9d8368f4
Boden, Stuart
83976b65-e90f-42d1-9a01-fe9cfc571bf8
Chong, Harold
795aa67f-29e5-480f-b1bc-9bd5c0d558e1
Mizuta, H.
c03e841e-f9cf-4f99-99a0-2a9261fb1345
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Zelai, Taharh
dae04f28-259f-4b97-9f47-dadf2a663b51
Iwasaki, Takuya
b9de92ae-a490-4cb3-8e39-d4ad9d8368f4
Boden, Stuart
83976b65-e90f-42d1-9a01-fe9cfc571bf8
Chong, Harold
795aa67f-29e5-480f-b1bc-9bd5c0d558e1
Mizuta, H.
c03e841e-f9cf-4f99-99a0-2a9261fb1345
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2

Zelai, Taharh, Iwasaki, Takuya, Boden, Stuart, Chong, Harold, Mizuta, H. and Tsuchiya, Yoshishige (2017) Tip-Enhanced Raman characterization of He-ion-irradiated CVD graphene channels. 43rd International Conference on Micro and Nanoengineering, Braga, Portugal. 18 - 22 Sep 2017. 1 pp .

Record type: Conference or Workshop Item (Paper)

Abstract

Graphene has been attracting significant attention for various types of device applications due to its unique properties emerging from the atomically-thin 2-dimentional layer. In particular for micro- and nanoscale device applications, how to control defects in graphene and how to observe the effects of defects are some of the most important issues to understand mechanisms behind device operation and to gain more flexibility in designing device structures [1,2]. While oxygen plasma, ion bombardment and focused ion beam (FIB) have been employed to introduce defects [1-3], helium ion irradiation via Helium Ion Microscope (HIM) is an attractive method because of excellent spatial resolution and position controllability. Effects of He ion irradiation on graphene have been investigated via Raman spectroscopy [4] and transport properties [5]. However to study the edge and boundary between the irradiated and non-irradiated regions, advanced tools with higher spatial resolution would be useful. In this work we have applied Tip-Enhanced Raman Spectroscopy (TERS) for He-ion-irradiated graphene for the first time to study effects of irradiation in details, in particular focusing on the boundary of the irradiated regions.

Text
MNE2017_Taharh_20170515 - Accepted Manuscript
Download (144kB)

More information

Accepted/In Press date: 29 June 2017
Published date: 18 September 2017
Venue - Dates: 43rd International Conference on Micro and Nanoengineering, Braga, Portugal, 2017-09-18 - 2017-09-22

Identifiers

Local EPrints ID: 413942
URI: https://eprints.soton.ac.uk/id/eprint/413942
PURE UUID: c75a2ddf-7950-44f9-aecf-7160bd93d1e0
ORCID for Stuart Boden: ORCID iD orcid.org/0000-0002-4232-1828
ORCID for Harold Chong: ORCID iD orcid.org/0000-0002-7110-5761

Catalogue record

Date deposited: 11 Sep 2017 16:31
Last modified: 14 Mar 2019 05:08

Export record

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of https://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×