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Experimental study on the influence of vent aperture size and distribution on arc motion and interruption in low-voltage switching devices

Experimental study on the influence of vent aperture size and distribution on arc motion and interruption in low-voltage switching devices
Experimental study on the influence of vent aperture size and distribution on arc motion and interruption in low-voltage switching devices
Enhanced switching performance during the interruption process is achieved when the arc quickly enters and stays within the splitter plate region with the arc itself remaining attached to the surface of the plates. It is well known that the
vent design in low-voltage switching devices (LVSDs) has a significant influence on arc motion during an interruption event: however, there has been limited experimental studies correlating arc motion in the whole quenching chamber, including splitter plates region, to the size and distribution of the vent apertures,
which are important for plasma flow in LVSDs. This paper uses high speed optical arc imaging to investigate arc motion in a LVSD as the vent aperture conditions are varied. It is shown that the arc moves further and more quickly if there is the larger vent size in the quenching chamber. In addition, the well distributed vent contributes to an increase in arc motion velocity and reduction in total arc duration.
Arc imaging system, low-voltage switching devices, vent conditions, switching performance
Shin, Dongkyu
1d29980e-4426-416b-858e-1b5c7734183b
Golosnoy, Igor O.
40603f91-7488-49ea-830f-24dd930573d1
McBride, John W.
d9429c29-9361-4747-9ba3-376297cb8770
Bull, Thomas G.
531098f0-7422-4822-a045-cf8e5ab0a04e
Shin, Dongkyu
1d29980e-4426-416b-858e-1b5c7734183b
Golosnoy, Igor O.
40603f91-7488-49ea-830f-24dd930573d1
McBride, John W.
d9429c29-9361-4747-9ba3-376297cb8770
Bull, Thomas G.
531098f0-7422-4822-a045-cf8e5ab0a04e

Shin, Dongkyu, Golosnoy, Igor O., McBride, John W. and Bull, Thomas G. (2017) Experimental study on the influence of vent aperture size and distribution on arc motion and interruption in low-voltage switching devices. ICEPE-ST 2017: 4th International Conference on Electric Power Equipment - Switching Technology, Xi'an Grand Park Hotel, Xi'an, China. 22 - 25 Oct 2017. 5 pp . (In Press)

Record type: Conference or Workshop Item (Paper)

Abstract

Enhanced switching performance during the interruption process is achieved when the arc quickly enters and stays within the splitter plate region with the arc itself remaining attached to the surface of the plates. It is well known that the
vent design in low-voltage switching devices (LVSDs) has a significant influence on arc motion during an interruption event: however, there has been limited experimental studies correlating arc motion in the whole quenching chamber, including splitter plates region, to the size and distribution of the vent apertures,
which are important for plasma flow in LVSDs. This paper uses high speed optical arc imaging to investigate arc motion in a LVSD as the vent aperture conditions are varied. It is shown that the arc moves further and more quickly if there is the larger vent size in the quenching chamber. In addition, the well distributed vent contributes to an increase in arc motion velocity and reduction in total arc duration.

Text
ICEPE2017 Full Paper_754417 - Accepted Manuscript
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More information

Accepted/In Press date: 11 September 2017
Venue - Dates: ICEPE-ST 2017: 4th International Conference on Electric Power Equipment - Switching Technology, Xi'an Grand Park Hotel, Xi'an, China, 2017-10-22 - 2017-10-25
Keywords: Arc imaging system, low-voltage switching devices, vent conditions, switching performance

Identifiers

Local EPrints ID: 414233
URI: http://eprints.soton.ac.uk/id/eprint/414233
PURE UUID: 9d8f02ba-4839-4def-b378-28acbf3589b1
ORCID for John W. McBride: ORCID iD orcid.org/0000-0002-3024-0326

Catalogue record

Date deposited: 20 Sep 2017 16:31
Last modified: 16 Mar 2024 05:44

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Contributors

Author: Dongkyu Shin
Author: Igor O. Golosnoy
Author: John W. McBride ORCID iD
Author: Thomas G. Bull

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