Carpenter, Lewis Glynn, Cooper, Peter, Holmes, Christopher, Gawith, Corin, Gates, James and Smith, Peter (2015) Micromilled silica refractometer with nanoscale surface roughness. European Conference on Lasers and Electro-Optics, CLEO 2015, , Munich, Germany. 20 - 24 Jun 2015.
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Published date: 21 June 2015
Venue - Dates:
European Conference on Lasers and Electro-Optics, CLEO 2015, , Munich, Germany, 2015-06-20 - 2015-06-24
Identifiers
Local EPrints ID: 414300
URI: http://eprints.soton.ac.uk/id/eprint/414300
PURE UUID: ebf096ae-ddaa-4ed0-894f-a2c024392902
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Date deposited: 26 Sep 2017 16:30
Last modified: 09 Jan 2022 03:23
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Contributors
Author:
Lewis Glynn Carpenter
Author:
Peter Cooper
Author:
Corin Gawith
Author:
James Gates
Author:
Peter Smith
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