Wide area mapping of liquid crystal devices with passive and active command layers
Wide area mapping of liquid crystal devices with passive and active command layers
We track the non-uniformity of a wide area liquid crystal device using multiple cross-polarized intensity measurements. They give us not only accurate estimates of the core physical liquid crystal parameters, such as elastic constants, but also spatial maps of the device properties, including the liquid crystal thickness and pretilt angle. A bootstrapping statistical analysis, coupled with the multiple measurements, gives us reliable error bars on all the measured parameters.
Liquid crystals, liquid crystal devices, all-optical devices, nondestructive testing, optical inspection
9050-9056
Bennett, Thomas
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Proctor, Matthew B.
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Forster, Jonathan
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Perivolari, Eleni
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Podoliak, Nina
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Sugden, Matthew
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Kirke, Roger
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Regrettier, Thomas
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Heiser, Thomas
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Kaczmarek, Malgosia
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D'alessandro, Giampaolo
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9 November 2017
Bennett, Thomas
9a342b50-e08a-47a8-adb2-1d8d51a9604b
Proctor, Matthew B.
fe521936-b99a-435e-bbdc-d09f114b5943
Forster, Jonathan
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Perivolari, Eleni
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Podoliak, Nina
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Sugden, Matthew
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Kirke, Roger
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Regrettier, Thomas
3527887d-fc03-439a-96f8-d37dda07e9cd
Heiser, Thomas
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Kaczmarek, Malgosia
408ec59b-8dba-41c1-89d0-af846d1bf327
D'alessandro, Giampaolo
bad097e1-9506-4b6e-aa56-3e67a526e83b
Bennett, Thomas, Proctor, Matthew B., Forster, Jonathan, Perivolari, Eleni, Podoliak, Nina, Sugden, Matthew, Kirke, Roger, Regrettier, Thomas, Heiser, Thomas, Kaczmarek, Malgosia and D'alessandro, Giampaolo
(2017)
Wide area mapping of liquid crystal devices with passive and active command layers.
Applied Optics, 56 (32), .
(doi:10.1364/AO.56.009050).
Abstract
We track the non-uniformity of a wide area liquid crystal device using multiple cross-polarized intensity measurements. They give us not only accurate estimates of the core physical liquid crystal parameters, such as elastic constants, but also spatial maps of the device properties, including the liquid crystal thickness and pretilt angle. A bootstrapping statistical analysis, coupled with the multiple measurements, gives us reliable error bars on all the measured parameters.
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More information
Accepted/In Press date: 9 October 2017
e-pub ahead of print date: 9 November 2017
Published date: 9 November 2017
Keywords:
Liquid crystals, liquid crystal devices, all-optical devices, nondestructive testing, optical inspection
Identifiers
Local EPrints ID: 415630
URI: http://eprints.soton.ac.uk/id/eprint/415630
ISSN: 0003-6935
PURE UUID: 3d7bda1d-d62f-488b-9ec8-107b4747ed72
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Date deposited: 16 Nov 2017 17:30
Last modified: 16 Mar 2024 05:55
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Contributors
Author:
Thomas Bennett
Author:
Matthew B. Proctor
Author:
Jonathan Forster
Author:
Eleni Perivolari
Author:
Nina Podoliak
Author:
Matthew Sugden
Author:
Roger Kirke
Author:
Thomas Regrettier
Author:
Thomas Heiser
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