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Wide area mapping of liquid crystal devices with passive and active command layers

Wide area mapping of liquid crystal devices with passive and active command layers
Wide area mapping of liquid crystal devices with passive and active command layers
We track the non-uniformity of a wide area liquid crystal device using multiple cross-polarized intensity measurements. They give us not only accurate estimates of the core physical liquid crystal parameters, such as elastic constants, but also spatial maps of the device properties, including the liquid crystal thickness and pretilt angle. A bootstrapping statistical analysis, coupled with the multiple measurements, gives us reliable error bars on all the measured parameters.
Liquid crystals, liquid crystal devices, all-optical devices, nondestructive testing, optical inspection
0003-6935
9050-9056
Bennett, Thomas
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Proctor, Matthew B.
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Forster, Jonathan
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Perivolari, Eleni
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Podoliak, Nina
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Sugden, Matthew
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Kirke, Roger
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Regrettier, Thomas
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Heiser, Thomas
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Kaczmarek, Malgosia
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D'alessandro, Giampaolo
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Bennett, Thomas
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Proctor, Matthew B.
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Forster, Jonathan
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Perivolari, Eleni
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Podoliak, Nina
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Sugden, Matthew
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Kirke, Roger
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Regrettier, Thomas
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Heiser, Thomas
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Kaczmarek, Malgosia
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D'alessandro, Giampaolo
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Bennett, Thomas, Proctor, Matthew B., Forster, Jonathan, Perivolari, Eleni, Podoliak, Nina, Sugden, Matthew, Kirke, Roger, Regrettier, Thomas, Heiser, Thomas, Kaczmarek, Malgosia and D'alessandro, Giampaolo (2017) Wide area mapping of liquid crystal devices with passive and active command layers. Applied Optics, 56 (32), 9050-9056. (doi:10.1364/AO.56.009050).

Record type: Article

Abstract

We track the non-uniformity of a wide area liquid crystal device using multiple cross-polarized intensity measurements. They give us not only accurate estimates of the core physical liquid crystal parameters, such as elastic constants, but also spatial maps of the device properties, including the liquid crystal thickness and pretilt angle. A bootstrapping statistical analysis, coupled with the multiple measurements, gives us reliable error bars on all the measured parameters.

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Accepted/In Press date: 9 October 2017
e-pub ahead of print date: 9 November 2017
Keywords: Liquid crystals, liquid crystal devices, all-optical devices, nondestructive testing, optical inspection

Identifiers

Local EPrints ID: 415630
URI: https://eprints.soton.ac.uk/id/eprint/415630
ISSN: 0003-6935
PURE UUID: 3d7bda1d-d62f-488b-9ec8-107b4747ed72
ORCID for Jonathan Forster: ORCID iD orcid.org/0000-0002-7867-3411
ORCID for Nina Podoliak: ORCID iD orcid.org/0000-0002-3146-0355
ORCID for Giampaolo D'alessandro: ORCID iD orcid.org/0000-0001-9166-9356

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Date deposited: 16 Nov 2017 17:30
Last modified: 24 May 2019 00:38

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Contributors

Author: Thomas Bennett
Author: Matthew B. Proctor
Author: Eleni Perivolari
Author: Nina Podoliak ORCID iD
Author: Matthew Sugden
Author: Roger Kirke
Author: Thomas Regrettier
Author: Thomas Heiser

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