Germanium-on-silicon waveguides operating at mid-infrared wavelengths up to 8.5 μm
Germanium-on-silicon waveguides operating at mid-infrared wavelengths up to 8.5 μm
We report transmission measurements of germanium on silicon waveguides in the 7.5–8.5 μm wavelength range, with a minimum propagation loss of 2.5 dB/cm at 7.575 μm. However, we find an unexpected strongly increasing loss at higher wavelengths, potential causes of which we discuss in detail. We also demonstrate the first germanium on silicon multimode interferometers operating in this range, as well as grating couplers optimized for measurement using a long wavelength infrared camera. Finally, we use an implementation of the “cut-back” method for loss measurements that allows simultaneous transmission measurement through multiple waveguides of different lengths, and we use dicing in the ductile regime for fast and reproducible high quality optical waveguide end-facet preparation.
Integrated optics, Infrared, Semiconductors
27431-27441
Nedeljković, Milos
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Soler Penadés, Jordi
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Mittal, Vinita
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Murugan, Ganapathy Senthil
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Khokhar, Ali Z.
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Littlejohns, Callum
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Carpenter, Lewis G.
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Gawith, Corin B. E.
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Wilkinson, James S.
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Mashanovich, Goran Z.
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30 October 2017
Nedeljković, Milos
b64e21c2-1b95-479d-a35c-3456dff8c796
Soler Penadés, Jordi
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Mittal, Vinita
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Murugan, Ganapathy Senthil
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Khokhar, Ali Z.
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Littlejohns, Callum
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Carpenter, Lewis G.
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Gawith, Corin B. E.
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Wilkinson, James S.
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Mashanovich, Goran Z.
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Nedeljković, Milos, Soler Penadés, Jordi, Mittal, Vinita, Murugan, Ganapathy Senthil, Khokhar, Ali Z., Littlejohns, Callum, Carpenter, Lewis G., Gawith, Corin B. E., Wilkinson, James S. and Mashanovich, Goran Z.
(2017)
Germanium-on-silicon waveguides operating at mid-infrared wavelengths up to 8.5 μm.
Optics Express, 25 (22), .
(doi:10.1364/OE.25.027431).
Abstract
We report transmission measurements of germanium on silicon waveguides in the 7.5–8.5 μm wavelength range, with a minimum propagation loss of 2.5 dB/cm at 7.575 μm. However, we find an unexpected strongly increasing loss at higher wavelengths, potential causes of which we discuss in detail. We also demonstrate the first germanium on silicon multimode interferometers operating in this range, as well as grating couplers optimized for measurement using a long wavelength infrared camera. Finally, we use an implementation of the “cut-back” method for loss measurements that allows simultaneous transmission measurement through multiple waveguides of different lengths, and we use dicing in the ductile regime for fast and reproducible high quality optical waveguide end-facet preparation.
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oe-25-22-27431
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Accepted/In Press date: 14 September 2017
e-pub ahead of print date: 24 October 2017
Published date: 30 October 2017
Keywords:
Integrated optics, Infrared, Semiconductors
Identifiers
Local EPrints ID: 416108
URI: http://eprints.soton.ac.uk/id/eprint/416108
ISSN: 1094-4087
PURE UUID: 52d5850f-bf07-4ef7-b937-10a36160fad8
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Date deposited: 04 Dec 2017 17:30
Last modified: 04 Aug 2022 01:47
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Contributors
Author:
Jordi Soler Penadés
Author:
Vinita Mittal
Author:
Ali Z. Khokhar
Author:
Lewis G. Carpenter
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