Multi-wavelength EAM based optical sampling for performance monitoring in high bit-rate systems
Multi-wavelength EAM based optical sampling for performance monitoring in high bit-rate systems
The intensity and phase profiles of eight 10 Gbit/s WDM channels on a 200 GHz grid have been simultaneously measured using a spectrally resolved optical gating technique, based on sampling with a single electro-absorption modulator.
Roelens, M.A.F.
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Thomsen, B.C.
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Richardson, D.J.
ebfe1ff9-d0c2-4e52-b7ae-c1b13bccdef3
Roelens, M.A.F.
6cbc7320-55ce-471c-bd8e-fb20be79c935
Thomsen, B.C.
aed3f8c7-8ab2-4b78-a960-f1e0aa351441
Richardson, D.J.
ebfe1ff9-d0c2-4e52-b7ae-c1b13bccdef3
Roelens, M.A.F., Thomsen, B.C. and Richardson, D.J.
(2004)
Multi-wavelength EAM based optical sampling for performance monitoring in high bit-rate systems.
ECOC 2004, Stockholm.
05 - 09 Sep 2004.
2 pp
.
Record type:
Conference or Workshop Item
(Paper)
Abstract
The intensity and phase profiles of eight 10 Gbit/s WDM channels on a 200 GHz grid have been simultaneously measured using a spectrally resolved optical gating technique, based on sampling with a single electro-absorption modulator.
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2913.pdf
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More information
e-pub ahead of print date: 2004
Additional Information:
We4.P116
Venue - Dates:
ECOC 2004, Stockholm, 2004-09-05 - 2004-09-09
Organisations:
Optoelectronics Research Centre
Identifiers
Local EPrints ID: 41710
URI: http://eprints.soton.ac.uk/id/eprint/41710
PURE UUID: 0a2affaf-58ef-41c4-aeeb-c8647f1b3076
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Date deposited: 16 Oct 2006
Last modified: 16 Mar 2024 02:40
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Contributors
Author:
M.A.F. Roelens
Author:
B.C. Thomsen
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