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Multi-wavelength EAM based optical sampling for performance monitoring in high bit-rate systems

Multi-wavelength EAM based optical sampling for performance monitoring in high bit-rate systems
Multi-wavelength EAM based optical sampling for performance monitoring in high bit-rate systems
The intensity and phase profiles of eight 10 Gbit/s WDM channels on a 200 GHz grid have been simultaneously measured using a spectrally resolved optical gating technique, based on sampling with a single electro-absorption modulator.
Roelens, M.A.F.
6cbc7320-55ce-471c-bd8e-fb20be79c935
Thomsen, B.C.
aed3f8c7-8ab2-4b78-a960-f1e0aa351441
Richardson, D.J.
ebfe1ff9-d0c2-4e52-b7ae-c1b13bccdef3
Roelens, M.A.F.
6cbc7320-55ce-471c-bd8e-fb20be79c935
Thomsen, B.C.
aed3f8c7-8ab2-4b78-a960-f1e0aa351441
Richardson, D.J.
ebfe1ff9-d0c2-4e52-b7ae-c1b13bccdef3

Roelens, M.A.F., Thomsen, B.C. and Richardson, D.J. (2004) Multi-wavelength EAM based optical sampling for performance monitoring in high bit-rate systems. ECOC 2004. 05 - 09 Sep 2004. 2 pp .

Record type: Conference or Workshop Item (Paper)

Abstract

The intensity and phase profiles of eight 10 Gbit/s WDM channels on a 200 GHz grid have been simultaneously measured using a spectrally resolved optical gating technique, based on sampling with a single electro-absorption modulator.

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More information

e-pub ahead of print date: 2004
Additional Information: We4.P116
Venue - Dates: ECOC 2004, 2004-09-05 - 2004-09-09
Organisations: Optoelectronics Research Centre

Identifiers

Local EPrints ID: 41710
URI: https://eprints.soton.ac.uk/id/eprint/41710
PURE UUID: 0a2affaf-58ef-41c4-aeeb-c8647f1b3076
ORCID for D.J. Richardson: ORCID iD orcid.org/0000-0002-7751-1058

Catalogue record

Date deposited: 16 Oct 2006
Last modified: 06 Mar 2019 01:37

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