Effect of initial annealing temperature on microstructural development and microhardness in high-purity copper processed by high-pressure torsion
Effect of initial annealing temperature on microstructural development and microhardness in high-purity copper processed by high-pressure torsion
The effect of the initial annealing temperature on the evolution of microstructure and microhardness in high purity OFHC Cu was investigated after processing by HPT. Disks of Cu were annealed for one hour at two different annealing temperatures, 400 and 800°C, and then processed by HPT at room temperature under a pressure of 6.0 GPa for 1/4, 1/2, 1, 5 and 10 turns. Samples were stored for 6 months after HPT processing to examine the self-annealing effects. Electron backscattered diffraction (EBSD) measurements were recorded for each disk at three positions: center, mid-radius and near edge. Microhardness measurements were also recorded along the diameters of each disk. Both alloys showed rapid hardening and then strain softening in the very early stages of straining due to self-annealing with a clear delay in the onset of softening in the alloy initially annealed at 800°C. This delay was due to the relatively larger initial grain size compared to the alloy initially annealed at 400°C. The final microstructures consisted of homogeneous fine grain sizes having average sizes of ~0.28 and ~0.34 μm for the alloys initially annealed at 400 and 800°C, respectively. A new model is proposed to describe the behavior of the hardness evolution by HPT in high purity OFHC Cu.
1700503 (1-10)
Alhajeri, Saleh N.
7f3030c8-31ae-4a81-914d-3012d7abdfb1
Almazrouee, Abdulla I.
6aaff277-2dcc-4dbd-afd0-75620aa6b6a9
Al-Fadhalah, Khaled J.
a7b40edf-e05c-4583-b596-01441ed09615
Langdon, Terence
86e69b4f-e16d-4830-bf8a-5a9c11f0de86
16 January 2018
Alhajeri, Saleh N.
7f3030c8-31ae-4a81-914d-3012d7abdfb1
Almazrouee, Abdulla I.
6aaff277-2dcc-4dbd-afd0-75620aa6b6a9
Al-Fadhalah, Khaled J.
a7b40edf-e05c-4583-b596-01441ed09615
Langdon, Terence
86e69b4f-e16d-4830-bf8a-5a9c11f0de86
Alhajeri, Saleh N., Almazrouee, Abdulla I., Al-Fadhalah, Khaled J. and Langdon, Terence
(2018)
Effect of initial annealing temperature on microstructural development and microhardness in high-purity copper processed by high-pressure torsion.
Advanced Engineering Materials, 20, .
(doi:10.1002/adem.201700503).
Abstract
The effect of the initial annealing temperature on the evolution of microstructure and microhardness in high purity OFHC Cu was investigated after processing by HPT. Disks of Cu were annealed for one hour at two different annealing temperatures, 400 and 800°C, and then processed by HPT at room temperature under a pressure of 6.0 GPa for 1/4, 1/2, 1, 5 and 10 turns. Samples were stored for 6 months after HPT processing to examine the self-annealing effects. Electron backscattered diffraction (EBSD) measurements were recorded for each disk at three positions: center, mid-radius and near edge. Microhardness measurements were also recorded along the diameters of each disk. Both alloys showed rapid hardening and then strain softening in the very early stages of straining due to self-annealing with a clear delay in the onset of softening in the alloy initially annealed at 800°C. This delay was due to the relatively larger initial grain size compared to the alloy initially annealed at 400°C. The final microstructures consisted of homogeneous fine grain sizes having average sizes of ~0.28 and ~0.34 μm for the alloys initially annealed at 400 and 800°C, respectively. A new model is proposed to describe the behavior of the hardness evolution by HPT in high purity OFHC Cu.
Text
Saleh-OFHC Cu-Text Revised-TGL
- Accepted Manuscript
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Accepted/In Press date: 28 July 2017
e-pub ahead of print date: 29 August 2017
Published date: 16 January 2018
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Local EPrints ID: 417558
URI: http://eprints.soton.ac.uk/id/eprint/417558
ISSN: 1438-1656
PURE UUID: 6afb70f1-fd26-42ca-9df0-0192c1c5f408
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Date deposited: 02 Feb 2018 17:31
Last modified: 15 Jun 2024 04:01
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Author:
Saleh N. Alhajeri
Author:
Abdulla I. Almazrouee
Author:
Khaled J. Al-Fadhalah
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