He, Fei, MacDonald, Kevin F. and Fang, Xu (2018) Coherent absorption at interfaces for film thickness measurement and plasmonic selective excitation. In International Conference on Nano-photonics and Nano-optoelectronics (ICNN) 2018. 1 pp .
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Conference or Workshop Item
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Abstract
In this oral presentation, we demonstrate using two coherent light beams to measure the thickness of absorptive thin films and selectively excite plasmonic resonances at the surface of transparent bulk substrates.
Text
Coherent absorption at interfaces for film thickness measurement and plasmonic selective excitation
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Accepted/In Press date: 1 February 2018
Published date: 25 April 2018
Venue - Dates:
International Conference on Nano-photonics and Nano-optoelectronics, Pacifico Yokohama, Yokohama, Japan, 2018-04-25 - 2018-04-27
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Local EPrints ID: 418528
URI: http://eprints.soton.ac.uk/id/eprint/418528
PURE UUID: 585581a4-59e3-4b9e-8526-39f9f685092c
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Date deposited: 09 Mar 2018 17:31
Last modified: 16 Mar 2024 06:16
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Contributors
Author:
Fei He
Author:
Kevin F. MacDonald
Author:
Xu Fang
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