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Coherent absorption at interfaces for film thickness measurement and plasmonic selective excitation

Coherent absorption at interfaces for film thickness measurement and plasmonic selective excitation
Coherent absorption at interfaces for film thickness measurement and plasmonic selective excitation
In this oral presentation, we demonstrate using two coherent light beams to measure the thickness of absorptive thin films and selectively excite plasmonic resonances at the surface of transparent bulk substrates.
He, Fei
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MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Fang, Xu
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He, Fei
0b5b12e2-82ec-407b-8e4f-a8ba024d9fb3
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Fang, Xu
96b4b212-496b-4d68-82a4-06df70f94a86

He, Fei, MacDonald, Kevin F. and Fang, Xu (2018) Coherent absorption at interfaces for film thickness measurement and plasmonic selective excitation. In International Conference on Nano-photonics and Nano-optoelectronics (ICNN) 2018. 1 pp .

Record type: Conference or Workshop Item (Paper)

Abstract

In this oral presentation, we demonstrate using two coherent light beams to measure the thickness of absorptive thin films and selectively excite plasmonic resonances at the surface of transparent bulk substrates.

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Coherent absorption at interfaces for film thickness measurement and plasmonic selective excitation - Accepted Manuscript
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Accepted/In Press date: 1 February 2018
Published date: 25 April 2018
Venue - Dates: International Conference on Nano-photonics and Nano-optoelectronics, Pacifico Yokohama, Yokohama, Japan, 2018-04-24 - 2018-04-26
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Identifiers

Local EPrints ID: 418528
URI: http://eprints.soton.ac.uk/id/eprint/418528
PURE UUID: 585581a4-59e3-4b9e-8526-39f9f685092c
ORCID for Kevin F. MacDonald: ORCID iD orcid.org/0000-0002-3877-2976
ORCID for Xu Fang: ORCID iD orcid.org/0000-0003-1735-2654

Catalogue record

Date deposited: 09 Mar 2018 17:31
Last modified: 03 Nov 2020 05:01

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