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Coherent illumination spectroscopy of nanostructures and thin films on thick substrates

Coherent illumination spectroscopy of nanostructures and thin films on thick substrates
Coherent illumination spectroscopy of nanostructures and thin films on thick substrates
Many nanophotonic and nanoelectronic devices contain nanostructures and ultrathin films on the surface of a thick, effectively semi-infinite, substrate. Here we propose a spectroscopic technique based upon coherent illumination, for characterising such samples. The method uses two counter-propagating light beams to generate specific field configurations at the substrate surface plane, which can be modulated, for example, to selectively excite and thereby discriminate between resonant modes of plasmonic nanostructures, or to measure thin films thickness with nanometre resolution. The technique offers a variety of practical applications for the coherent illumination in solid state physics, analytical chemistry, biochemistry and nano-engineering.
1094-4087
12415-12423
He, Fei
0b5b12e2-82ec-407b-8e4f-a8ba024d9fb3
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Fang, Xu
96b4b212-496b-4d68-82a4-06df70f94a86
He, Fei
0b5b12e2-82ec-407b-8e4f-a8ba024d9fb3
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Fang, Xu
96b4b212-496b-4d68-82a4-06df70f94a86

He, Fei, MacDonald, Kevin F. and Fang, Xu (2018) Coherent illumination spectroscopy of nanostructures and thin films on thick substrates. Optics Express, 26 (10), 12415-12423. (doi:10.1364/OE.26.012415).

Record type: Article

Abstract

Many nanophotonic and nanoelectronic devices contain nanostructures and ultrathin films on the surface of a thick, effectively semi-infinite, substrate. Here we propose a spectroscopic technique based upon coherent illumination, for characterising such samples. The method uses two counter-propagating light beams to generate specific field configurations at the substrate surface plane, which can be modulated, for example, to selectively excite and thereby discriminate between resonant modes of plasmonic nanostructures, or to measure thin films thickness with nanometre resolution. The technique offers a variety of practical applications for the coherent illumination in solid state physics, analytical chemistry, biochemistry and nano-engineering.

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More information

Accepted/In Press date: 6 April 2018
e-pub ahead of print date: 1 May 2018
Published date: 14 May 2018

Identifiers

Local EPrints ID: 419441
URI: http://eprints.soton.ac.uk/id/eprint/419441
ISSN: 1094-4087
PURE UUID: 8dfe68bf-d55f-4cbe-b6dc-d4bd56ce3de7
ORCID for Kevin F. MacDonald: ORCID iD orcid.org/0000-0002-3877-2976
ORCID for Xu Fang: ORCID iD orcid.org/0000-0003-1735-2654

Catalogue record

Date deposited: 12 Apr 2018 16:30
Last modified: 07 Oct 2020 04:49

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