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Combination of solid state and electrochemical impedance spectroscopy to explore effects of porosity in sol-gel derived BaTiO3 thin films

Combination of solid state and electrochemical impedance spectroscopy to explore effects of porosity in sol-gel derived BaTiO3 thin films
Combination of solid state and electrochemical impedance spectroscopy to explore effects of porosity in sol-gel derived BaTiO3 thin films
BaTiO3 thin films were deposited onto polycrystalline Pt using a dip-coating technique, with annealing temperatures of 750 to 900 °C. To avoid film imperfections such as cracking or regions of zero BaTiO3 coverage (pinholes), key conditions, including aging periods, water content, and spin velocities, were refined to produce a pinhole free, uniform films with some porosity. Whilst those coated a single time short circuited during electrical characterization, this could be avoided in films produced by multiple coating cycles. The relative permittivity of a 600 nm BaTiO3 film was measured at 290 by fitting solid state impedance data in the frequency range 100 Hz to 1 MHz. Electrochemical impedance with an aqueous electrolyte allowed evaluation of the porosity, which remained fairly constant between one and five coating cycles. Using this method it was possible to estimate the relative permittivity of the BaTiO3 itself as 374 and hence to evaluate the increase in the relative permittivity that could be achievable by minimizing porosity.
2470-1343
6880-6887
Whittam, Joshua
9793bbc2-ee36-4f64-a585-22f18ccef85a
Hector, Andrew L.
f19a8f31-b37f-4474-b32a-b7cf05b9f0e5
Kavanagh, Christopher
014ba2de-fcb7-4a40-ae32-6d4c3bdaec5a
Owen, John R.
067986ea-f3f3-4a83-bc87-7387cc5ac85d
Reid, Gillian
37d35b11-40ce-48c5-a68e-f6ce04cd4037
Whittam, Joshua
9793bbc2-ee36-4f64-a585-22f18ccef85a
Hector, Andrew L.
f19a8f31-b37f-4474-b32a-b7cf05b9f0e5
Kavanagh, Christopher
014ba2de-fcb7-4a40-ae32-6d4c3bdaec5a
Owen, John R.
067986ea-f3f3-4a83-bc87-7387cc5ac85d
Reid, Gillian
37d35b11-40ce-48c5-a68e-f6ce04cd4037

Whittam, Joshua, Hector, Andrew L., Kavanagh, Christopher, Owen, John R. and Reid, Gillian (2018) Combination of solid state and electrochemical impedance spectroscopy to explore effects of porosity in sol-gel derived BaTiO3 thin films. ACS Omega, 3 (6), 6880-6887, [ao-2018-001732]. (doi:10.1021/acsomega.8b00173).

Record type: Article

Abstract

BaTiO3 thin films were deposited onto polycrystalline Pt using a dip-coating technique, with annealing temperatures of 750 to 900 °C. To avoid film imperfections such as cracking or regions of zero BaTiO3 coverage (pinholes), key conditions, including aging periods, water content, and spin velocities, were refined to produce a pinhole free, uniform films with some porosity. Whilst those coated a single time short circuited during electrical characterization, this could be avoided in films produced by multiple coating cycles. The relative permittivity of a 600 nm BaTiO3 film was measured at 290 by fitting solid state impedance data in the frequency range 100 Hz to 1 MHz. Electrochemical impedance with an aqueous electrolyte allowed evaluation of the porosity, which remained fairly constant between one and five coating cycles. Using this method it was possible to estimate the relative permittivity of the BaTiO3 itself as 374 and hence to evaluate the increase in the relative permittivity that could be achievable by minimizing porosity.

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BaTiO3 EIS 270118 - Accepted Manuscript
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Accepted/In Press date: 25 April 2018
e-pub ahead of print date: 25 June 2018
Published date: 30 June 2018

Identifiers

Local EPrints ID: 420202
URI: http://eprints.soton.ac.uk/id/eprint/420202
ISSN: 2470-1343
PURE UUID: 5738bca5-db6a-44a2-89fd-6866255e1f85
ORCID for Andrew L. Hector: ORCID iD orcid.org/0000-0002-9964-2163
ORCID for John R. Owen: ORCID iD orcid.org/0000-0002-4938-3693
ORCID for Gillian Reid: ORCID iD orcid.org/0000-0001-5349-3468

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Date deposited: 02 May 2018 16:30
Last modified: 07 Oct 2020 06:49

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Contributors

Author: Joshua Whittam
Author: Christopher Kavanagh
Author: John R. Owen ORCID iD
Author: Gillian Reid ORCID iD

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