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Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices

Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices
Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices
Advanced photonic probing techniques are of great importance for the development of non-contact wafer-scale testing of photonic chips. Ultrafast photomodulation has been identified as a powerful new tool capable of remotely mapping photonic devices through a scanning perturbation. Here, we develop photomodulation maps into a quantitative technique through a general and rigorous method based on Lorentz reciprocity that allows the prediction of transmittance perturbation maps for arbitrary linear photonic systems with great accuracy and minimal computational cost. Excellent agreement is obtained between predicted and experimental maps of various optical multimode-interference devices, thereby allowing direct comparison of a device under test with a physical model of an ideal design structure. In addition to constituting a promising route for optical testing in photonics manufacturing, ultrafast perturbation mapping may be used for design optimization of photonic structures with reconfigurable functionalities.
1-10
Vynck, Kevin
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Dinsdale, Nicholas J.
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Chen, Bigeng
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Bruck, Roman
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Khokhar, Ali Z.
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Reynolds, Scott A.
ed8f5413-c0c0-4449-ba35-626485f23a75
Crudgington, Lee
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Thomson, David J.
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Reed, Graham T.
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Lalanne, Philippe
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Muskens, Otto L.
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Vynck, Kevin
fa5b6236-c2d0-47a3-90a9-5c849b9cb22f
Dinsdale, Nicholas J.
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Chen, Bigeng
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Bruck, Roman
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Khokhar, Ali Z.
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Reynolds, Scott A.
ed8f5413-c0c0-4449-ba35-626485f23a75
Crudgington, Lee
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Thomson, David J.
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Reed, Graham T.
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Lalanne, Philippe
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Muskens, Otto L.
2284101a-f9ef-4d79-8951-a6cda5bfc7f9

Vynck, Kevin, Dinsdale, Nicholas J., Chen, Bigeng, Bruck, Roman, Khokhar, Ali Z., Reynolds, Scott A., Crudgington, Lee, Thomson, David J., Reed, Graham T., Lalanne, Philippe and Muskens, Otto L. (2018) Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices. Nature Communications, 9 (1), 1-10. (doi:10.1038/s41467-018-04662-2).

Record type: Article

Abstract

Advanced photonic probing techniques are of great importance for the development of non-contact wafer-scale testing of photonic chips. Ultrafast photomodulation has been identified as a powerful new tool capable of remotely mapping photonic devices through a scanning perturbation. Here, we develop photomodulation maps into a quantitative technique through a general and rigorous method based on Lorentz reciprocity that allows the prediction of transmittance perturbation maps for arbitrary linear photonic systems with great accuracy and minimal computational cost. Excellent agreement is obtained between predicted and experimental maps of various optical multimode-interference devices, thereby allowing direct comparison of a device under test with a physical model of an ideal design structure. In addition to constituting a promising route for optical testing in photonics manufacturing, ultrafast perturbation mapping may be used for design optimization of photonic structures with reconfigurable functionalities.

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Accepted/In Press date: 17 May 2018
e-pub ahead of print date: 8 June 2018
Published date: 1 December 2018

Identifiers

Local EPrints ID: 421412
URI: https://eprints.soton.ac.uk/id/eprint/421412
PURE UUID: 9ead743b-f626-48df-a429-16cb31369808
ORCID for Nicholas J. Dinsdale: ORCID iD orcid.org/0000-0001-9870-5700
ORCID for Bigeng Chen: ORCID iD orcid.org/0000-0003-4925-2308
ORCID for Otto L. Muskens: ORCID iD orcid.org/0000-0003-0693-5504

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Date deposited: 11 Jun 2018 16:30
Last modified: 03 Dec 2019 01:42

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Contributors

Author: Kevin Vynck
Author: Bigeng Chen ORCID iD
Author: Roman Bruck
Author: Ali Z. Khokhar
Author: Scott A. Reynolds
Author: Lee Crudgington
Author: Graham T. Reed
Author: Philippe Lalanne
Author: Otto L. Muskens ORCID iD

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