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Tunable X-ray speckle-based phase-contrast and dark-field imaging using the unified modulated pattern analysis approach

Tunable X-ray speckle-based phase-contrast and dark-field imaging using the unified modulated pattern analysis approach
Tunable X-ray speckle-based phase-contrast and dark-field imaging using the unified modulated pattern analysis approach

X-ray phase-contrast and dark-field imaging provides valuable, complementary information about the specimen under study. Among the multimodal X-ray imaging methods, X-ray grating interferometry and speckle-based imaging have drawn particular attention, which, however, in their common implementations incur certain limitations that can restrict their range of applications. Recently, the unified modulated pattern analysis (UMPA) approach was proposed to overcome these limitations and combine grating- and speckle-based imaging in a single approach. Here, we demonstrate the multimodal imaging capabilities of UMPA and highlight its tunable character regarding spatial resolution, signal sensitivity and scan time by using different reconstruction parameters.

Computerized Tomography (CT) and Computed Radiography (CR), Inspection with x-rays, Multi-modality systems, X-ray radiography and digital radiography (DR)
1748-0221
Zdora, M. C.
cea26261-9f86-4fa1-9122-2371a3818563
Thibault, P.
975a4c7b-6ca9-4958-b362-9eba10ab926b
Deyhle, H.
aba9cd34-97a0-4238-8255-af673e3beb1a
Vila-Comamala, J.
71a323a6-e669-4bbf-bfe7-a9827f234d42
Rau, C.
f8828e6e-e5fc-4b6f-b673-409c92e9ccf1
Zanette, I.
4527ee3f-7686-4e8b-9beb-a56f8a32cb17
Zdora, M. C.
cea26261-9f86-4fa1-9122-2371a3818563
Thibault, P.
975a4c7b-6ca9-4958-b362-9eba10ab926b
Deyhle, H.
aba9cd34-97a0-4238-8255-af673e3beb1a
Vila-Comamala, J.
71a323a6-e669-4bbf-bfe7-a9827f234d42
Rau, C.
f8828e6e-e5fc-4b6f-b673-409c92e9ccf1
Zanette, I.
4527ee3f-7686-4e8b-9beb-a56f8a32cb17

Zdora, M. C., Thibault, P., Deyhle, H., Vila-Comamala, J., Rau, C. and Zanette, I. (2018) Tunable X-ray speckle-based phase-contrast and dark-field imaging using the unified modulated pattern analysis approach. Journal of Instrumentation, 13 (5), [C05005]. (doi:10.1088/1748-0221/13/05/C05005).

Record type: Article

Abstract

X-ray phase-contrast and dark-field imaging provides valuable, complementary information about the specimen under study. Among the multimodal X-ray imaging methods, X-ray grating interferometry and speckle-based imaging have drawn particular attention, which, however, in their common implementations incur certain limitations that can restrict their range of applications. Recently, the unified modulated pattern analysis (UMPA) approach was proposed to overcome these limitations and combine grating- and speckle-based imaging in a single approach. Here, we demonstrate the multimodal imaging capabilities of UMPA and highlight its tunable character regarding spatial resolution, signal sensitivity and scan time by using different reconstruction parameters.

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More information

Accepted/In Press date: 26 April 2018
e-pub ahead of print date: 8 May 2018
Published date: 8 May 2018
Keywords: Computerized Tomography (CT) and Computed Radiography (CR), Inspection with x-rays, Multi-modality systems, X-ray radiography and digital radiography (DR)

Identifiers

Local EPrints ID: 421906
URI: http://eprints.soton.ac.uk/id/eprint/421906
ISSN: 1748-0221
PURE UUID: 731d3a1d-365e-49c7-a613-3a6ac890e299
ORCID for P. Thibault: ORCID iD orcid.org/0000-0003-1278-8846

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Date deposited: 09 Jul 2018 16:30
Last modified: 07 Oct 2020 02:08

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