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Multiscale X-ray imaging using ptychography

Multiscale X-ray imaging using ptychography
Multiscale X-ray imaging using ptychography

The success of ptychography and other imaging experiments at third-generation X-ray sources is apparent from their increasingly widespread application and the improving quality of the images they produce both for resolution and contrast and in terms of relaxation of experimental constraints. The wider availability of highly coherent X-rays stimulates the development of several complementary techniques which have seen limited mutual integration in recent years. This paper presents a framework in which some of the established imaging techniques – with particular regard for ptychography – are flexibly applied to tackle the variable requirements occurring at typical synchrotron experiments. In such a framework one can obtain low-resolution images of whole samples and smoothly zoom in on specific regions of interest as they are revealed by switching to a higher-resolution imaging mode. The techniques involved range from full-field microscopy, to reach the widest fields of view (>mm), to ptychography, to achieve the highest resolution (<100 nm), and have been implemented at the I13 Coherence Branchline at Diamond Light Source.

coherent diffraction, phase contrast, ptychography, scanning transmission X-ray microscopy, X-ray imaging
0909-0495
1214-1221
Sala, Simone
78135997-917f-4720-ac5a-d5d8935c2f89
Kuppili, Venkata S.C.
6bb1849e-a918-45b8-929a-8da9461e92ea
Chalkidis, Stefanos
eb735ab6-923a-455b-8f4c-7f6ccadf48d4
Batey, Darren J.
73723c09-27e5-4a8a-994e-c1b87c3c97ae
Shi, Xiaowen
09ecabcd-14f1-4357-a55d-bf4f07d15b5d
Rau, Christoph
da5d605e-4232-4b59-99c5-59ed77546891
Thibault, Pierre
975a4c7b-6ca9-4958-b362-9eba10ab926b
Sala, Simone
78135997-917f-4720-ac5a-d5d8935c2f89
Kuppili, Venkata S.C.
6bb1849e-a918-45b8-929a-8da9461e92ea
Chalkidis, Stefanos
eb735ab6-923a-455b-8f4c-7f6ccadf48d4
Batey, Darren J.
73723c09-27e5-4a8a-994e-c1b87c3c97ae
Shi, Xiaowen
09ecabcd-14f1-4357-a55d-bf4f07d15b5d
Rau, Christoph
da5d605e-4232-4b59-99c5-59ed77546891
Thibault, Pierre
975a4c7b-6ca9-4958-b362-9eba10ab926b

Sala, Simone, Kuppili, Venkata S.C., Chalkidis, Stefanos, Batey, Darren J., Shi, Xiaowen, Rau, Christoph and Thibault, Pierre (2018) Multiscale X-ray imaging using ptychography. Journal of Synchrotron Radiation, 25 (4), 1214-1221. (doi:10.1107/S1600577518007221).

Record type: Article

Abstract

The success of ptychography and other imaging experiments at third-generation X-ray sources is apparent from their increasingly widespread application and the improving quality of the images they produce both for resolution and contrast and in terms of relaxation of experimental constraints. The wider availability of highly coherent X-rays stimulates the development of several complementary techniques which have seen limited mutual integration in recent years. This paper presents a framework in which some of the established imaging techniques – with particular regard for ptychography – are flexibly applied to tackle the variable requirements occurring at typical synchrotron experiments. In such a framework one can obtain low-resolution images of whole samples and smoothly zoom in on specific regions of interest as they are revealed by switching to a higher-resolution imaging mode. The techniques involved range from full-field microscopy, to reach the widest fields of view (>mm), to ptychography, to achieve the highest resolution (<100 nm), and have been implemented at the I13 Coherence Branchline at Diamond Light Source.

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More information

Accepted/In Press date: 14 May 2018
e-pub ahead of print date: 17 June 2018
Published date: 1 July 2018
Keywords: coherent diffraction, phase contrast, ptychography, scanning transmission X-ray microscopy, X-ray imaging

Identifiers

Local EPrints ID: 422696
URI: http://eprints.soton.ac.uk/id/eprint/422696
ISSN: 0909-0495
PURE UUID: 758570c6-7fb6-43d6-a0b9-30afbc0c41e6
ORCID for Pierre Thibault: ORCID iD orcid.org/0000-0003-1278-8846

Catalogue record

Date deposited: 31 Jul 2018 16:30
Last modified: 17 Mar 2024 12:08

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Contributors

Author: Simone Sala
Author: Venkata S.C. Kuppili
Author: Stefanos Chalkidis
Author: Darren J. Batey
Author: Xiaowen Shi
Author: Christoph Rau
Author: Pierre Thibault ORCID iD

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