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Combinatorial synthesis and screening of chalcogenide materials for data storage

Combinatorial synthesis and screening of chalcogenide materials for data storage
Combinatorial synthesis and screening of chalcogenide materials for data storage
For more than 15 years researchers at the Optoelectronics Research Centre at the University of Southampton have been developing novel compositions of chalcogenide glasses for a wide range of optical applications. Recently this expertise has been combined with those of Ilika Technologies Ltd and the School of Chemistry to focus on the development of enhanced chalcogenide materials for OUM and optical data storage applications. In our talk, we report on our high throughput methodology which allows rapid, reproducible and comprehensive mapping of phase diagrams and screening of optical, thermal and electrical properties. These procedures were initially applied to Ge:Sb:Te compositions where we were able to synthesis and analyse over 4000 sample points spanning the entire ternary system. In order to process such large volumes of compositions, novel screening techniques and strategies have been employed. We are applying this methodology to other novel compositions and our findings are reported.
Guerin, S.
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Hayden, B.
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Hewak, D.W.
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Purdy, G.
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Simpson, R.E.
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Guerin, S.
e185e0c2-85c6-4d1c-a2cf-cd2f410d346f
Hayden, B.
04522727-70ad-47c8-9644-8f335977b9b6
Hewak, D.W.
87c80070-c101-4f7a-914f-4cc3131e3db0
Purdy, G.
d05164e9-57c6-40e9-a270-603fcfcff0b8
Simpson, R.E.
56e8b388-f479-49c7-bd14-de1ac014d40a

Guerin, S., Hayden, B., Hewak, D.W., Purdy, G. and Simpson, R.E. (2005) Combinatorial synthesis and screening of chalcogenide materials for data storage. PCOS 17th Symposium, Japan. 17 - 18 Nov 2005.

Record type: Conference or Workshop Item (Paper)

Abstract

For more than 15 years researchers at the Optoelectronics Research Centre at the University of Southampton have been developing novel compositions of chalcogenide glasses for a wide range of optical applications. Recently this expertise has been combined with those of Ilika Technologies Ltd and the School of Chemistry to focus on the development of enhanced chalcogenide materials for OUM and optical data storage applications. In our talk, we report on our high throughput methodology which allows rapid, reproducible and comprehensive mapping of phase diagrams and screening of optical, thermal and electrical properties. These procedures were initially applied to Ge:Sb:Te compositions where we were able to synthesis and analyse over 4000 sample points spanning the entire ternary system. In order to process such large volumes of compositions, novel screening techniques and strategies have been employed. We are applying this methodology to other novel compositions and our findings are reported.

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More information

Published date: 2005
Venue - Dates: PCOS 17th Symposium, Japan, 2005-11-17 - 2005-11-18

Identifiers

Local EPrints ID: 42407
URI: http://eprints.soton.ac.uk/id/eprint/42407
PURE UUID: 7332c4fd-de40-4641-8f89-75faa466847e
ORCID for D.W. Hewak: ORCID iD orcid.org/0000-0002-2093-5773

Catalogue record

Date deposited: 12 Dec 2006
Last modified: 15 Mar 2024 08:48

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Contributors

Author: S. Guerin
Author: B. Hayden
Author: D.W. Hewak ORCID iD
Author: G. Purdy
Author: R.E. Simpson

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