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A reliable PUF in a dual function SRAM

A reliable PUF in a dual function SRAM
A reliable PUF in a dual function SRAM

An SRAM Physical Unclonable Function (SRAM-PUF) is a potential solution for lightweight secure key generation, and is particularly suitable for resource-constrained security devices. An SRAM-PUF is able to generate random and unique cryptographic keys based on start-up values (SUVs) by exploiting intrinsic manufacturing process variations. For cost efficiency the available on-chip SRAM in a system can be reused as a PUF. As CMOS technology scales down, ageing-induced Negative Bias Temperature Instability (NBTI) becomes more pronounced, resulting in asymmetric degradation of memory bit cells after prolonged storage of the same bit values. This causes unreliable SUVs for an SRAM-PUF. In this paper, we investigate the bit probabilities in an instruction cache and the effect on long-term reliability. We show that the signal probability in a 32-bit ARM instruction cache has a predictable pattern. Hence, we propose a bit selection technique to mitigate the NBTI effect when an instruction cache is used as a PUF. We show that this technique can reduce the predicted bit error in an SRAM-PUF from 14.18% to 5.58% over 5 years. Consequently, as the bit error reduces, the area overhead of the error-correction is about 6× smaller compared to that without a bit selection technique.

76-81
Institute of Electrical and Electronics Engineers Inc.
Mispan, Mohd Svafiq
568c91c3-c200-441c-887b-8f299635b94e
Duan, Shengyu
cb8534a0-9971-40b9-8c11-72eca641f3a1
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Mispan, Mohd Svafiq
568c91c3-c200-441c-887b-8f299635b94e
Duan, Shengyu
cb8534a0-9971-40b9-8c11-72eca641f3a1
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0

Mispan, Mohd Svafiq, Duan, Shengyu, Halak, Basel and Zwolinski, Mark (2018) A reliable PUF in a dual function SRAM. In 2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation, PATMOS 2018. Institute of Electrical and Electronics Engineers Inc. pp. 76-81 . (doi:10.1109/PATMOS.2018.8464143).

Record type: Conference or Workshop Item (Paper)

Abstract

An SRAM Physical Unclonable Function (SRAM-PUF) is a potential solution for lightweight secure key generation, and is particularly suitable for resource-constrained security devices. An SRAM-PUF is able to generate random and unique cryptographic keys based on start-up values (SUVs) by exploiting intrinsic manufacturing process variations. For cost efficiency the available on-chip SRAM in a system can be reused as a PUF. As CMOS technology scales down, ageing-induced Negative Bias Temperature Instability (NBTI) becomes more pronounced, resulting in asymmetric degradation of memory bit cells after prolonged storage of the same bit values. This causes unreliable SUVs for an SRAM-PUF. In this paper, we investigate the bit probabilities in an instruction cache and the effect on long-term reliability. We show that the signal probability in a 32-bit ARM instruction cache has a predictable pattern. Hence, we propose a bit selection technique to mitigate the NBTI effect when an instruction cache is used as a PUF. We show that this technique can reduce the predicted bit error in an SRAM-PUF from 14.18% to 5.58% over 5 years. Consequently, as the bit error reduces, the area overhead of the error-correction is about 6× smaller compared to that without a bit selection technique.

Full text not available from this repository.

More information

Published date: 13 September 2018
Venue - Dates: 28th IEEE International Symposium on Power and Timing Modeling, Optimization and Simulation, PATMOS 2018, Platja d'Aro, Spain, 2018-07-02 - 2018-07-04

Identifiers

Local EPrints ID: 425520
URI: https://eprints.soton.ac.uk/id/eprint/425520
PURE UUID: d68648a8-d8c2-4c75-99e0-9aade34dd76f
ORCID for Basel Halak: ORCID iD orcid.org/0000-0003-3470-7226
ORCID for Mark Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 23 Oct 2018 16:30
Last modified: 19 Jul 2019 10:31

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