Double edge-diffraction mediated virtual shadow for distance metrology
Double edge-diffraction mediated virtual shadow for distance metrology
We report a form of double edge-diffraction (DED) for the first time, in which successive diffractive effects between two opaque objects leads to a virtual shadow of one object that protrudes from the shadow of the other. Analogous to classic edge and slit diffractions, the method to observe DED is simple, yet its effect is intriguingly different. Existing sensing techniques cannot measure the distance of highly reflective or absorptive opaque objects. To address this problem in certain scenarios, we propose a new technique based on DED that is the first to work for all opaque objects with well-defined edges.
diffraction, distance, double, edge, measurement, metrology
1-10
Chen, George Y.
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Lee, Timothy
beb3b88e-3e5a-4c3f-8636-bb6de8040fcc
Kang, Yvonne Qiongyue
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Monro, Tanya M.
198e1e56-0be6-41bb-a2ce-aea4f12965d8
Lancaster, David G.
4c1e2bb1-fa1a-4a42-86eb-58025c753e06
Chen, George Y.
b766d3f7-a6dc-4c15-8f00-17ad044348c1
Lee, Timothy
beb3b88e-3e5a-4c3f-8636-bb6de8040fcc
Kang, Yvonne Qiongyue
90dfe5cc-7816-4a2f-b9ac-7c5002304b89
Monro, Tanya M.
198e1e56-0be6-41bb-a2ce-aea4f12965d8
Lancaster, David G.
4c1e2bb1-fa1a-4a42-86eb-58025c753e06
Chen, George Y., Lee, Timothy, Kang, Yvonne Qiongyue, Monro, Tanya M. and Lancaster, David G.
(2018)
Double edge-diffraction mediated virtual shadow for distance metrology.
New Journal of Physics, 20 (10), , [103029].
(doi:10.1088/1367-2630/aae5c7).
Abstract
We report a form of double edge-diffraction (DED) for the first time, in which successive diffractive effects between two opaque objects leads to a virtual shadow of one object that protrudes from the shadow of the other. Analogous to classic edge and slit diffractions, the method to observe DED is simple, yet its effect is intriguingly different. Existing sensing techniques cannot measure the distance of highly reflective or absorptive opaque objects. To address this problem in certain scenarios, we propose a new technique based on DED that is the first to work for all opaque objects with well-defined edges.
Text
Chen 2018 New J. Phys. 20 103029
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More information
Accepted/In Press date: 2 October 2018
e-pub ahead of print date: 23 October 2018
Keywords:
diffraction, distance, double, edge, measurement, metrology
Identifiers
Local EPrints ID: 426260
URI: http://eprints.soton.ac.uk/id/eprint/426260
ISSN: 1367-2630
PURE UUID: 13136caa-74f8-40d8-94bc-bfd7fddeab60
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Date deposited: 21 Nov 2018 17:30
Last modified: 18 Mar 2024 02:27
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Contributors
Author:
George Y. Chen
Author:
Yvonne Qiongyue Kang
Author:
Tanya M. Monro
Author:
David G. Lancaster
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