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Live Demonstration: An embedded environmental control micro-chamber system for RRAM memristor characterisation

Live Demonstration: An embedded environmental control micro-chamber system for RRAM memristor characterisation
Live Demonstration: An embedded environmental control micro-chamber system for RRAM memristor characterisation

We demonstrate an environmental control system for testing Resistive Random Access Memory technologies under accurately controlled humidity and temperature. The demonstrated system compresses the functionality of existing environmental control systems into a low cost, desktop-size solution, aimed at providing results quickly and with minimum installation and running overheads.

Institute of Electrical and Electronics Engineers Inc.
Abbey, T.
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Serb, A.
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Vasilakis, N.
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Michalas, L.
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Khiat, A.
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Stathopoulos, S.
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Prodromakis, T.
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Abbey, T.
64fcf5bd-e20e-4fb8-9ec4-391ad8a0a7a8
Serb, A.
30f5ec26-f51d-42b3-85fd-0325a27a792c
Vasilakis, N.
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Michalas, L.
25d00d54-5900-485e-bd52-d3505fe881a7
Khiat, A.
bf549ddd-5356-4a7d-9c12-eb6c0d904050
Stathopoulos, S.
98d12f06-ad01-4708-be19-a97282968ee6
Prodromakis, T.
d58c9c10-9d25-4d22-b155-06c8437acfbf

Abbey, T., Serb, A., Vasilakis, N., Michalas, L., Khiat, A., Stathopoulos, S. and Prodromakis, T. (2018) Live Demonstration: An embedded environmental control micro-chamber system for RRAM memristor characterisation. In 2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018 - Proceedings. vol. 2018-May, Institute of Electrical and Electronics Engineers Inc.. (doi:10.1109/ISCAS.2018.8351845).

Record type: Conference or Workshop Item (Paper)

Abstract

We demonstrate an environmental control system for testing Resistive Random Access Memory technologies under accurately controlled humidity and temperature. The demonstrated system compresses the functionality of existing environmental control systems into a low cost, desktop-size solution, aimed at providing results quickly and with minimum installation and running overheads.

Full text not available from this repository.

More information

Published date: 26 April 2018
Venue - Dates: 2018 IEEE International Symposium on Circuits and Systems, Florence, Italy, 2018-05-27 - 2018-05-30

Identifiers

Local EPrints ID: 426995
URI: https://eprints.soton.ac.uk/id/eprint/426995
PURE UUID: 845f9c00-f663-4e20-8179-e21e7fc6ad87
ORCID for S. Stathopoulos: ORCID iD orcid.org/0000-0002-0833-6209
ORCID for T. Prodromakis: ORCID iD orcid.org/0000-0002-6267-6909

Catalogue record

Date deposited: 20 Dec 2018 17:30
Last modified: 10 Dec 2019 01:35

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