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GPU-Accelerated soft error rate analysis of large-scale integrated circuits

GPU-Accelerated soft error rate analysis of large-scale integrated circuits
GPU-Accelerated soft error rate analysis of large-scale integrated circuits

In this article, a team of researchers from Shiraz University and the Shahid Bahonar University of Kerman, Iran, investigates soft error rate (SER) estimation. They propose an analytical framework to estimate SER accurately and an implementation on graphic processing units (GPUs) that is able to scale to circuits composed of thousands of gates. The framework exploits several levels of parallelism in the SER estimation process to map it efficiently onto GPUs.

GPU, parallel, reliability, soft error rate, Transient fault
2168-2356
78-85
Sabet, M. Amin
f5c0e55f-6f0c-4f56-9d6d-7de19d6fb136
Ghavami, Behnam
21a91345-64b9-41b9-a592-2fc8bbecfb82
Raji, Mohsen
3a367bf8-1ed4-4b1a-88b4-726562402613
Sabet, M. Amin
f5c0e55f-6f0c-4f56-9d6d-7de19d6fb136
Ghavami, Behnam
21a91345-64b9-41b9-a592-2fc8bbecfb82
Raji, Mohsen
3a367bf8-1ed4-4b1a-88b4-726562402613

Sabet, M. Amin, Ghavami, Behnam and Raji, Mohsen (2018) GPU-Accelerated soft error rate analysis of large-scale integrated circuits. IEEE Design and Test, 35 (6), 78-85, [8426019]. (doi:10.1109/MDAT.2018.2863703).

Record type: Review

Abstract

In this article, a team of researchers from Shiraz University and the Shahid Bahonar University of Kerman, Iran, investigates soft error rate (SER) estimation. They propose an analytical framework to estimate SER accurately and an implementation on graphic processing units (GPUs) that is able to scale to circuits composed of thousands of gates. The framework exploits several levels of parallelism in the SER estimation process to map it efficiently onto GPUs.

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More information

e-pub ahead of print date: 6 August 2018
Published date: 1 December 2018
Keywords: GPU, parallel, reliability, soft error rate, Transient fault

Identifiers

Local EPrints ID: 427011
URI: http://eprints.soton.ac.uk/id/eprint/427011
ISSN: 2168-2356
PURE UUID: e2a6e703-a350-469e-83f3-e2d943644746

Catalogue record

Date deposited: 20 Dec 2018 17:30
Last modified: 15 Mar 2024 23:28

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Contributors

Author: M. Amin Sabet
Author: Behnam Ghavami
Author: Mohsen Raji

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