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Effect of long-term storage on microstructure and microhardness stability in OFHC copper processed by high-pressure torsion

Effect of long-term storage on microstructure and microhardness stability in OFHC copper processed by high-pressure torsion
Effect of long-term storage on microstructure and microhardness stability in OFHC copper processed by high-pressure torsion
Tests are conducted to evaluate the effect of long-term storage on the microstructure and microhardness of an oxygen-free high conductivity (OFHC) copper after processing by high-pressure torsion (HPT) for various numbers of revolutions at ambient temperature. Results are presented for samples subjected to storage at room temperature through periods of either 1.25 or 7 years. The results show that an increase in storage time leads to a coarsening of the ultrafine-grained structure produced by HPT processing and a corresponding decrease in the microhardess where this is associated with the occurrence of recrystallization and grain growth. Plots of hardness against equivalent strain reveal a three-stage behavior with much lower hardness values over a range of equivalent strains of ~2-8. This behavior is similar after both storage periods but the hardness values are lower and the grain sizes are larger after storage for the longer time. The results demonstrate that long-term storage has a significantly detrimental effect on the microstructure and hardness of ultrafine-grained OFHC Cu
1438-1656
Almazrouee, Abdulla I.
6413812a-e357-4aa4-9353-e784c587df95
Al-Fadhalah, Khaled J.
9e109c22-8168-42b3-8e6f-6393fa51c153
Alhajeri, Saleh N.
32728ba0-8d0d-4268-b58d-4e97f3bc54aa
Huang, Yi
9f4df815-51c1-4ee8-ad63-a92bf997103e
Langdon, Terence G.
86e69b4f-e16d-4830-bf8a-5a9c11f0de86
Almazrouee, Abdulla I.
6413812a-e357-4aa4-9353-e784c587df95
Al-Fadhalah, Khaled J.
9e109c22-8168-42b3-8e6f-6393fa51c153
Alhajeri, Saleh N.
32728ba0-8d0d-4268-b58d-4e97f3bc54aa
Huang, Yi
9f4df815-51c1-4ee8-ad63-a92bf997103e
Langdon, Terence G.
86e69b4f-e16d-4830-bf8a-5a9c11f0de86

Almazrouee, Abdulla I., Al-Fadhalah, Khaled J., Alhajeri, Saleh N., Huang, Yi and Langdon, Terence G. (2019) Effect of long-term storage on microstructure and microhardness stability in OFHC copper processed by high-pressure torsion. Advanced Engineering Materials. (doi:10.1002/adem.201801300).

Record type: Article

Abstract

Tests are conducted to evaluate the effect of long-term storage on the microstructure and microhardness of an oxygen-free high conductivity (OFHC) copper after processing by high-pressure torsion (HPT) for various numbers of revolutions at ambient temperature. Results are presented for samples subjected to storage at room temperature through periods of either 1.25 or 7 years. The results show that an increase in storage time leads to a coarsening of the ultrafine-grained structure produced by HPT processing and a corresponding decrease in the microhardess where this is associated with the occurrence of recrystallization and grain growth. Plots of hardness against equivalent strain reveal a three-stage behavior with much lower hardness values over a range of equivalent strains of ~2-8. This behavior is similar after both storage periods but the hardness values are lower and the grain sizes are larger after storage for the longer time. The results demonstrate that long-term storage has a significantly detrimental effect on the microstructure and hardness of ultrafine-grained OFHC Cu

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Abdulla_AEM2019_accepted manuscript - Accepted Manuscript
Restricted to Repository staff only until 14 February 2020.
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Accepted/In Press date: 14 January 2019
e-pub ahead of print date: 14 February 2019

Identifiers

Local EPrints ID: 427837
URI: https://eprints.soton.ac.uk/id/eprint/427837
ISSN: 1438-1656
PURE UUID: fa0d31fb-6098-419b-8b63-71131987b702
ORCID for Yi Huang: ORCID iD orcid.org/0000-0001-9259-8123
ORCID for Terence G. Langdon: ORCID iD orcid.org/0000-0003-3541-9250

Catalogue record

Date deposited: 30 Jan 2019 17:30
Last modified: 14 Mar 2019 01:45

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Contributors

Author: Abdulla I. Almazrouee
Author: Khaled J. Al-Fadhalah
Author: Saleh N. Alhajeri
Author: Yi Huang ORCID iD

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