The University of Southampton
University of Southampton Institutional Repository

The influence of Circuit Parameters on Molten Bridge Surface Degradation in a Au/MWCNT MEMS Switch Contact

The influence of Circuit Parameters on Molten Bridge Surface Degradation in a Au/MWCNT MEMS Switch Contact
The influence of Circuit Parameters on Molten Bridge Surface Degradation in a Au/MWCNT MEMS Switch Contact

The influence of circuit parameters on an Ohmic (metal-metal contact) MEMS (microelectromechanical system) switch contact pair are investigated under hot-switching (carrying current) circuit conditions below the arcing-threshold. A novel MEMS relay testing platform is used to investigate microscale contact surface change between individual switching events. The contact materials are a composite contact material of vertically-aligned carbon-nanotubes with a metallic (Au) layer, paired with an Au-coated ball contact. The evolution of the contact surface is evaluated along with the energy associated with the molten-metal bridge (MMB) phenomena. Circuit voltage is varied between 4 and 8 V DC and current between 20 and 50 mA to determine their influence on surface degradation. Two modes of voltage transient are observed. The first has been linked to the formation of a MMB and the second to a delamination event (DE) where the contacts separate with no MMB apparent. Results are presented on the relative likelihood of the DE or the MMB events occurring. After 100k cycles at switching conditions of 4V, 20 mA the contact surface demonstrates negligible wear. Increasing the current (4 V, 50 mA) or the voltage (8 V, 20 mA) both increase the average energy associated with opening and the contact wear. The increase in MMB energy and wear with supply voltage is unexpected and is discussed.

Contact wear., Hot switching, Low current switching, MEMS switching
359-365
Institute of Electrical and Electronics Engineers Inc.
Bull, Thomas G.
93bf0964-0be6-44a8-a4e3-f1637c509728
McBride, John W.
d9429c29-9361-4747-9ba3-376297cb8770
Jiang, Liudi
374f2414-51f0-418f-a316-e7db0d6dc4d1
Bull, Thomas G.
93bf0964-0be6-44a8-a4e3-f1637c509728
McBride, John W.
d9429c29-9361-4747-9ba3-376297cb8770
Jiang, Liudi
374f2414-51f0-418f-a316-e7db0d6dc4d1

Bull, Thomas G., McBride, John W. and Jiang, Liudi (2019) The influence of Circuit Parameters on Molten Bridge Surface Degradation in a Au/MWCNT MEMS Switch Contact. In Electrical Contacts - 2018, Proceedings of the 64th IEEE Holm Conference on Electrical Contacts, Holm 2018. vol. 2018-October, Institute of Electrical and Electronics Engineers Inc. pp. 359-365 . (doi:10.1109/HOLM.2018.8611757).

Record type: Conference or Workshop Item (Paper)

Abstract

The influence of circuit parameters on an Ohmic (metal-metal contact) MEMS (microelectromechanical system) switch contact pair are investigated under hot-switching (carrying current) circuit conditions below the arcing-threshold. A novel MEMS relay testing platform is used to investigate microscale contact surface change between individual switching events. The contact materials are a composite contact material of vertically-aligned carbon-nanotubes with a metallic (Au) layer, paired with an Au-coated ball contact. The evolution of the contact surface is evaluated along with the energy associated with the molten-metal bridge (MMB) phenomena. Circuit voltage is varied between 4 and 8 V DC and current between 20 and 50 mA to determine their influence on surface degradation. Two modes of voltage transient are observed. The first has been linked to the formation of a MMB and the second to a delamination event (DE) where the contacts separate with no MMB apparent. Results are presented on the relative likelihood of the DE or the MMB events occurring. After 100k cycles at switching conditions of 4V, 20 mA the contact surface demonstrates negligible wear. Increasing the current (4 V, 50 mA) or the voltage (8 V, 20 mA) both increase the average energy associated with opening and the contact wear. The increase in MMB energy and wear with supply voltage is unexpected and is discussed.

Full text not available from this repository.

More information

Published date: 14 January 2019
Venue - Dates: 64th IEEE Holm Conference on Electrical Contacts, Holm 2018, Albuquerque, United States, 2018-10-14 - 2018-10-18
Keywords: Contact wear., Hot switching, Low current switching, MEMS switching

Identifiers

Local EPrints ID: 430057
URI: https://eprints.soton.ac.uk/id/eprint/430057
PURE UUID: 8ff55931-8c9a-4f0b-8a6f-003589c6a01b
ORCID for Liudi Jiang: ORCID iD orcid.org/0000-0002-3400-825X

Catalogue record

Date deposited: 11 Apr 2019 16:30
Last modified: 20 Jul 2019 00:55

Export record

Altmetrics

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of https://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×