In-situ electrical characterisation of a photodiode during nano-structuring with a focussed ion beam
In-situ electrical characterisation of a photodiode during nano-structuring with a focussed ion beam
935-941
Rindermann, Jan Junis
2e54f42c-5f5e-45bb-b2b1-ea4c63a55044
Henini, Mohammed
4bb78e6b-d220-4496-ae53-f1e0737f39c5
Lagoudakis, Pavlos G.
ea50c228-f006-4edf-8459-60015d961bbf
March 2013
Rindermann, Jan Junis
2e54f42c-5f5e-45bb-b2b1-ea4c63a55044
Henini, Mohammed
4bb78e6b-d220-4496-ae53-f1e0737f39c5
Lagoudakis, Pavlos G.
ea50c228-f006-4edf-8459-60015d961bbf
Rindermann, Jan Junis, Henini, Mohammed and Lagoudakis, Pavlos G.
(2013)
In-situ electrical characterisation of a photodiode during nano-structuring with a focussed ion beam.
Applied Physics A: Materials Science & Processing, 110 (4), .
(doi:10.1007/s00339-012-7199-5).
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Published date: March 2013
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Local EPrints ID: 430551
URI: http://eprints.soton.ac.uk/id/eprint/430551
ISSN: 0947-8396
PURE UUID: 063a9b56-8431-48e8-86d6-eba1ad8c0dd5
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Date deposited: 03 May 2019 16:30
Last modified: 16 Mar 2024 01:33
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Author:
Jan Junis Rindermann
Author:
Mohammed Henini
Author:
Pavlos G. Lagoudakis
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