Simulations of multi-contrast x-ray imaging using near-field speckles
Simulations of multi-contrast x-ray imaging using near-field speckles
X-ray dark-field and phase-contrast imaging using near-field speckles is a novel technique that overcomes limitations inherent in conventional absorption x-ray imaging, i.e. poor contrast for features with similar density. Speckle-based imaging yields a wealth of information with a simple setup tolerant to polychromatic and divergent beams, and simple data acquisition and analysis procedures. Here, we present a simulation software used to model the image formation with the speckle-based technique, and we compare simulated results on a phantom sample with experimental synchrotron data. Thorough simulation of a speckle-based imaging experiment will help for better understanding and optimising the technique itself.
x-ray microscopy, phase-contrast imaging, dark-field imaging, near-field speckles, wavefront simulations, synchrotron radiation
Zdora, Marie-Christine
cea26261-9f86-4fa1-9122-2371a3818563
Thibault, Pierre
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Herzen, Julia
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Pfeiffer, Franz
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Zanette, Irene
39ee899c-0aae-4fac-aec6-826f848a8022
2016
Zdora, Marie-Christine
cea26261-9f86-4fa1-9122-2371a3818563
Thibault, Pierre
975a4c7b-6ca9-4958-b362-9eba10ab926b
Herzen, Julia
2f599af5-2bb2-481c-828f-22c05ceabc3f
Pfeiffer, Franz
90bfb684-c442-458c-8f10-64d0e89cbef1
Zanette, Irene
39ee899c-0aae-4fac-aec6-826f848a8022
Zdora, Marie-Christine, Thibault, Pierre, Herzen, Julia, Pfeiffer, Franz and Zanette, Irene
(2016)
Simulations of multi-contrast x-ray imaging using near-field speckles.
de Jonge, Martin D., Paterson, David J. and Ryan, Christopher G.
(eds.)
In XRM 2014: Proceedings of the 12th International Conference on X-Ray Microscopy.
vol. 1696,
AIP Publishing.
6 pp
.
(doi:10.1063/1.4937510).
Record type:
Conference or Workshop Item
(Paper)
Abstract
X-ray dark-field and phase-contrast imaging using near-field speckles is a novel technique that overcomes limitations inherent in conventional absorption x-ray imaging, i.e. poor contrast for features with similar density. Speckle-based imaging yields a wealth of information with a simple setup tolerant to polychromatic and divergent beams, and simple data acquisition and analysis procedures. Here, we present a simulation software used to model the image formation with the speckle-based technique, and we compare simulated results on a phantom sample with experimental synchrotron data. Thorough simulation of a speckle-based imaging experiment will help for better understanding and optimising the technique itself.
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Published date: 2016
Keywords:
x-ray microscopy, phase-contrast imaging, dark-field imaging, near-field speckles, wavefront simulations, synchrotron radiation
Identifiers
Local EPrints ID: 430804
URI: http://eprints.soton.ac.uk/id/eprint/430804
ISSN: 0094-243X
PURE UUID: 26702b9c-83e4-45d5-aabf-d7b000c2cf73
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Date deposited: 14 May 2019 16:30
Last modified: 16 Mar 2024 01:51
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Contributors
Author:
Marie-Christine Zdora
Author:
Pierre Thibault
Author:
Julia Herzen
Author:
Franz Pfeiffer
Author:
Irene Zanette
Editor:
Martin D. de Jonge
Editor:
David J. Paterson
Editor:
Christopher G. Ryan
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