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Simulations of multi-contrast x-ray imaging using near-field speckles

Simulations of multi-contrast x-ray imaging using near-field speckles
Simulations of multi-contrast x-ray imaging using near-field speckles
X-ray dark-field and phase-contrast imaging using near-field speckles is a novel technique that overcomes limitations inherent in conventional absorption x-ray imaging, i.e. poor contrast for features with similar density. Speckle-based imaging yields a wealth of information with a simple setup tolerant to polychromatic and divergent beams, and simple data acquisition and analysis procedures. Here, we present a simulation software used to model the image formation with the speckle-based technique, and we compare simulated results on a phantom sample with experimental synchrotron data. Thorough simulation of a speckle-based imaging experiment will help for better understanding and optimising the technique itself.
x-ray microscopy, phase-contrast imaging, dark-field imaging, near-field speckles, wavefront simulations, synchrotron radiation
0094-243X
AIP Publishing
Zdora, Marie-Christine
cea26261-9f86-4fa1-9122-2371a3818563
Thibault, Pierre
975a4c7b-6ca9-4958-b362-9eba10ab926b
Herzen, Julia
2f599af5-2bb2-481c-828f-22c05ceabc3f
Pfeiffer, Franz
90bfb684-c442-458c-8f10-64d0e89cbef1
Zanette, Irene
39ee899c-0aae-4fac-aec6-826f848a8022
de Jonge, Martin D.
Paterson, David J.
Ryan, Christopher G.
Zdora, Marie-Christine
cea26261-9f86-4fa1-9122-2371a3818563
Thibault, Pierre
975a4c7b-6ca9-4958-b362-9eba10ab926b
Herzen, Julia
2f599af5-2bb2-481c-828f-22c05ceabc3f
Pfeiffer, Franz
90bfb684-c442-458c-8f10-64d0e89cbef1
Zanette, Irene
39ee899c-0aae-4fac-aec6-826f848a8022
de Jonge, Martin D.
Paterson, David J.
Ryan, Christopher G.

Zdora, Marie-Christine, Thibault, Pierre, Herzen, Julia, Pfeiffer, Franz and Zanette, Irene (2016) Simulations of multi-contrast x-ray imaging using near-field speckles. de Jonge, Martin D., Paterson, David J. and Ryan, Christopher G. (eds.) In XRM 2014: Proceedings of the 12th International Conference on X-Ray Microscopy. vol. 1696, AIP Publishing. 6 pp . (doi:10.1063/1.4937510).

Record type: Conference or Workshop Item (Paper)

Abstract

X-ray dark-field and phase-contrast imaging using near-field speckles is a novel technique that overcomes limitations inherent in conventional absorption x-ray imaging, i.e. poor contrast for features with similar density. Speckle-based imaging yields a wealth of information with a simple setup tolerant to polychromatic and divergent beams, and simple data acquisition and analysis procedures. Here, we present a simulation software used to model the image formation with the speckle-based technique, and we compare simulated results on a phantom sample with experimental synchrotron data. Thorough simulation of a speckle-based imaging experiment will help for better understanding and optimising the technique itself.

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More information

Published date: 2016
Keywords: x-ray microscopy, phase-contrast imaging, dark-field imaging, near-field speckles, wavefront simulations, synchrotron radiation

Identifiers

Local EPrints ID: 430804
URI: http://eprints.soton.ac.uk/id/eprint/430804
ISSN: 0094-243X
PURE UUID: 26702b9c-83e4-45d5-aabf-d7b000c2cf73
ORCID for Pierre Thibault: ORCID iD orcid.org/0000-0003-1278-8846

Catalogue record

Date deposited: 14 May 2019 16:30
Last modified: 20 Jul 2019 00:33

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Contributors

Author: Marie-Christine Zdora
Author: Pierre Thibault ORCID iD
Author: Julia Herzen
Author: Franz Pfeiffer
Author: Irene Zanette
Editor: Martin D. de Jonge
Editor: David J. Paterson
Editor: Christopher G. Ryan

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