Imaging of high-frequency motion in artificial nanostructures
Imaging of high-frequency motion in artificial nanostructures
The development of nanomechanical photonic metamaterials and devices demands characterisation of fast movements typically picometer amplitude at MHz-GHz frequencies. Here we report on a new approach to the visualization of nanoscale movements based on the detection of secondary electrons and photons emerging from the interaction of focused electron beam with moving components of the nano-object, where the motion is activated thermally, or by external forces.
Liu, Tongjun
53eb4a71-ea7b-4aa7-b96d-b70c5df1dd63
Ou, Jun-Yu
3fb703e3-b222-46d2-b4ee-75f296d9d64d
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Zheludev, Nikolai
32fb6af7-97e4-4d11-bca6-805745e40cc6
16 September 2019
Liu, Tongjun
53eb4a71-ea7b-4aa7-b96d-b70c5df1dd63
Ou, Jun-Yu
3fb703e3-b222-46d2-b4ee-75f296d9d64d
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Zheludev, Nikolai
32fb6af7-97e4-4d11-bca6-805745e40cc6
Liu, Tongjun, Ou, Jun-Yu, MacDonald, Kevin F. and Zheludev, Nikolai
(2019)
Imaging of high-frequency motion in artificial nanostructures.
13th International Congress on Artificial Materials for Novel Wave Phenomena, , Rome, Italy.
16 - 21 Sep 2019.
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Conference or Workshop Item
(Paper)
Abstract
The development of nanomechanical photonic metamaterials and devices demands characterisation of fast movements typically picometer amplitude at MHz-GHz frequencies. Here we report on a new approach to the visualization of nanoscale movements based on the detection of secondary electrons and photons emerging from the interaction of focused electron beam with moving components of the nano-object, where the motion is activated thermally, or by external forces.
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Accepted/In Press date: 21 May 2019
Published date: 16 September 2019
Venue - Dates:
13th International Congress on Artificial Materials for Novel Wave Phenomena, , Rome, Italy, 2019-09-16 - 2019-09-21
Identifiers
Local EPrints ID: 431137
URI: http://eprints.soton.ac.uk/id/eprint/431137
PURE UUID: 6f0e158c-819b-4bf5-ba24-9cc247560cee
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Date deposited: 24 May 2019 16:30
Last modified: 16 Mar 2024 04:07
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Contributors
Author:
Tongjun Liu
Author:
Jun-Yu Ou
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