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Transient stress imaging after irradiation with a focused femtosecond laser pulse inside a single crystal

Transient stress imaging after irradiation with a focused femtosecond laser pulse inside a single crystal
Transient stress imaging after irradiation with a focused femtosecond laser pulse inside a single crystal
A focused femtosecond laser pulse inside a single crystal induces anisotropic structural changes, which depend on the atomic arrangement of the crystal. The transient stress after the photoexcitation should be responsible for the structural changes. In this study, we developed a novel transient stress observation system by time-resolved birefringence analysis and observed the relative amplitude and azimuth of the transient stresses after the photoexcitation inside MgO and LiF crystals. The principle and advantage of the observation system are described in this paper by comparing the system with a conventional stress observation method, a crossed-Nicols imaging method.
0021-4922
Tochio, Takaya
93a08d5d-cf9b-45cf-ba44-bfb92ce800fe
Sakakura, Masaaki
3bb15bbd-d590-4cba-ab5a-862dc7acd054
Shimotsuma, Yasuhiko
0664279b-def2-41d4-a5ec-207ce02013a7
Nishi, Masayuki
4ccdf7c3-f87c-40ab-9069-02eaee4487ce
Hirao, Kazuyuki
5cc5061d-6217-49ae-bc92-ff5b72b9c6c2
Miura, Kiyotaka
5dbc9159-ace0-4dd9-b18d-36f87ae78c47
Tochio, Takaya
93a08d5d-cf9b-45cf-ba44-bfb92ce800fe
Sakakura, Masaaki
3bb15bbd-d590-4cba-ab5a-862dc7acd054
Shimotsuma, Yasuhiko
0664279b-def2-41d4-a5ec-207ce02013a7
Nishi, Masayuki
4ccdf7c3-f87c-40ab-9069-02eaee4487ce
Hirao, Kazuyuki
5cc5061d-6217-49ae-bc92-ff5b72b9c6c2
Miura, Kiyotaka
5dbc9159-ace0-4dd9-b18d-36f87ae78c47

Tochio, Takaya, Sakakura, Masaaki, Shimotsuma, Yasuhiko, Nishi, Masayuki, Hirao, Kazuyuki and Miura, Kiyotaka (2012) Transient stress imaging after irradiation with a focused femtosecond laser pulse inside a single crystal. Japanese Journal of Applied Physics, 51 (12), [126602]. (doi:10.1143/JJAP.51.126602).

Record type: Article

Abstract

A focused femtosecond laser pulse inside a single crystal induces anisotropic structural changes, which depend on the atomic arrangement of the crystal. The transient stress after the photoexcitation should be responsible for the structural changes. In this study, we developed a novel transient stress observation system by time-resolved birefringence analysis and observed the relative amplitude and azimuth of the transient stresses after the photoexcitation inside MgO and LiF crystals. The principle and advantage of the observation system are described in this paper by comparing the system with a conventional stress observation method, a crossed-Nicols imaging method.

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More information

Accepted/In Press date: 30 September 2012
Published date: December 2012
Additional Information: No Southampton authors at time of publication

Identifiers

Local EPrints ID: 431151
URI: http://eprints.soton.ac.uk/id/eprint/431151
ISSN: 0021-4922
PURE UUID: 4ed1cd27-084f-48ee-a7a1-ec07c7f19bf7

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Date deposited: 24 May 2019 16:30
Last modified: 16 Mar 2024 01:56

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Contributors

Author: Takaya Tochio
Author: Masaaki Sakakura
Author: Yasuhiko Shimotsuma
Author: Masayuki Nishi
Author: Kazuyuki Hirao
Author: Kiyotaka Miura

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