Metamaterials for all-optical metrology with atomic scale resolution
Metamaterials for all-optical metrology with atomic scale resolution
Zheludev, Nikolai
32fb6af7-97e4-4d11-bca6-805745e40cc6
Yuan, G.H.
2fdbb2ad-0077-4cb8-b07a-76d65aa9aeff
16 September 2019
Zheludev, Nikolai
32fb6af7-97e4-4d11-bca6-805745e40cc6
Yuan, G.H.
2fdbb2ad-0077-4cb8-b07a-76d65aa9aeff
Zheludev, Nikolai and Yuan, G.H.
(2019)
Metamaterials for all-optical metrology with atomic scale resolution.
13th International Congress on Artificial Materials for Novel Wave Phenomena, , Rome, Italy.
16 - 21 Sep 2019.
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Published date: 16 September 2019
Venue - Dates:
13th International Congress on Artificial Materials for Novel Wave Phenomena, , Rome, Italy, 2019-09-16 - 2019-09-21
Identifiers
Local EPrints ID: 432307
URI: http://eprints.soton.ac.uk/id/eprint/432307
PURE UUID: 5043d902-85c4-4a31-971e-ea59da51147f
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Date deposited: 09 Jul 2019 16:30
Last modified: 23 Feb 2024 02:33
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Contributors
Author:
Nikolai Zheludev
Author:
G.H. Yuan
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