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Metamaterials for all-optical metrology with atomic scale resolution

Metamaterials for all-optical metrology with atomic scale resolution
Metamaterials for all-optical metrology with atomic scale resolution
Zheludev, Nikolai
32fb6af7-97e4-4d11-bca6-805745e40cc6
Yuan, G.H.
2fdbb2ad-0077-4cb8-b07a-76d65aa9aeff
Zheludev, Nikolai
32fb6af7-97e4-4d11-bca6-805745e40cc6
Yuan, G.H.
2fdbb2ad-0077-4cb8-b07a-76d65aa9aeff

Zheludev, Nikolai and Yuan, G.H. (2019) Metamaterials for all-optical metrology with atomic scale resolution. 13th International Congress on Artificial Materials for Novel Wave Phenomena, , Rome, Italy. 16 - 21 Sep 2019.

Record type: Conference or Workshop Item (Other)

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More information

Published date: 16 September 2019
Venue - Dates: 13th International Congress on Artificial Materials for Novel Wave Phenomena, , Rome, Italy, 2019-09-16 - 2019-09-21

Identifiers

Local EPrints ID: 432307
URI: http://eprints.soton.ac.uk/id/eprint/432307
PURE UUID: 5043d902-85c4-4a31-971e-ea59da51147f
ORCID for Nikolai Zheludev: ORCID iD orcid.org/0000-0002-1013-6636

Catalogue record

Date deposited: 09 Jul 2019 16:30
Last modified: 23 Feb 2024 02:33

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Contributors

Author: G.H. Yuan

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