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Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources

Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources
Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources

Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.

2334-2536
1106-1109
Vagovič, Patrik
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Sato, Tokushi
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Mikeš, Ladislav
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Mills, Grant
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Graceffa, Rita
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Mattsson, Frans
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Villanueva-Perez, Pablo
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Ershov, Alexey
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Faragó, Tomáš
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Uličný, Jozef
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Kirkwood, Henry
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Letrun, Romain
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Mokso, Rajmund
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Zdora, Marie Christine
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Olbinado, Margie P.
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Rack, Alexander
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Baumbach, Tilo
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Schulz, Joachim
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Meents, Alke
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Chapman, Henry N.
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Mancuso, Adrian P.
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Vagovič, Patrik
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Sato, Tokushi
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Mikeš, Ladislav
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Mills, Grant
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Graceffa, Rita
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Mattsson, Frans
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Villanueva-Perez, Pablo
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Ershov, Alexey
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Faragó, Tomáš
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Uličný, Jozef
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Kirkwood, Henry
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Letrun, Romain
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Mokso, Rajmund
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Zdora, Marie Christine
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Olbinado, Margie P.
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Rack, Alexander
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Baumbach, Tilo
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Schulz, Joachim
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Meents, Alke
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Chapman, Henry N.
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Mancuso, Adrian P.
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Vagovič, Patrik, Sato, Tokushi, Mikeš, Ladislav, Mills, Grant, Graceffa, Rita, Mattsson, Frans, Villanueva-Perez, Pablo, Ershov, Alexey, Faragó, Tomáš, Uličný, Jozef, Kirkwood, Henry, Letrun, Romain, Mokso, Rajmund, Zdora, Marie Christine, Olbinado, Margie P., Rack, Alexander, Baumbach, Tilo, Schulz, Joachim, Meents, Alke, Chapman, Henry N. and Mancuso, Adrian P. (2019) Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources. Optica, 6 (9), 1106-1109. (doi:10.1364/OPTICA.6.001106).

Record type: Article

Abstract

Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.

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Accepted/In Press date: 26 July 2019
Published date: 23 August 2019

Identifiers

Local EPrints ID: 438963
URI: http://eprints.soton.ac.uk/id/eprint/438963
ISSN: 2334-2536
PURE UUID: 69ae9d07-5fb4-4f87-8c93-aade88a6a91b

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Date deposited: 30 Mar 2020 16:30
Last modified: 07 Oct 2020 00:46

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Contributors

Author: Patrik Vagovič
Author: Tokushi Sato
Author: Ladislav Mikeš
Author: Grant Mills
Author: Rita Graceffa
Author: Frans Mattsson
Author: Pablo Villanueva-Perez
Author: Alexey Ershov
Author: Tomáš Faragó
Author: Jozef Uličný
Author: Henry Kirkwood
Author: Romain Letrun
Author: Rajmund Mokso
Author: Marie Christine Zdora
Author: Margie P. Olbinado
Author: Alexander Rack
Author: Tilo Baumbach
Author: Joachim Schulz
Author: Alke Meents
Author: Henry N. Chapman
Author: Adrian P. Mancuso

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