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State of the art of X-ray speckle-based phase-contrast and dark-field imaging

State of the art of X-ray speckle-based phase-contrast and dark-field imaging
State of the art of X-ray speckle-based phase-contrast and dark-field imaging

In the past few years, X-ray phase-contrast and dark-field imaging have evolved to be invaluable tools for non-destructive sample visualisation, delivering information inaccessible by conventional absorption imaging. X-ray phase-sensing techniques are furthermore increasingly used for at-wavelength metrology and optics characterisation. One of the latest additions to the group of differential phase-contrast methods is the X-ray speckle-based technique. It has drawn significant attention due to its simple and flexible experimental arrangement, cost-effectiveness and multimodal character, amongst others. Since its first demonstration at highly brilliant synchrotron sources, the method has seen rapid development, including the translation to polychromatic laboratory sources and extension to higher-energy X-rays. Recently, different advanced acquisition schemes have been proposed to tackle some of the main limitations of previous implementations. Current applications of the speckle-based method range from optics characterisation and wavefront measurement to biomedical imaging and materials science. This review provides an overview of the state of the art of the X-ray speckle-based technique. Its basic principles and different experimental implementations as well as the the latest advances and applications are illustrated. In the end, an outlook for anticipated future developments of this promising technique is given.

Metrology, Optics characterisation, X-ray dark-field imaging, X-ray multimodal imaging, X-ray near-field speckle, X-ray phase tomography, X-ray phase-contrast imaging, X-ray speckle-based imaging, X-ray wavefront sensing
0897-1889
1-36
Zdora, Marie Christine
a2e3b04b-aef4-42f8-9e96-4707149589fb
Zdora, Marie Christine
a2e3b04b-aef4-42f8-9e96-4707149589fb

Zdora, Marie Christine (2018) State of the art of X-ray speckle-based phase-contrast and dark-field imaging. Journal of Imaging, 4 (5), 1-36, [60]. (doi:10.3390/jimaging4050060).

Record type: Review

Abstract

In the past few years, X-ray phase-contrast and dark-field imaging have evolved to be invaluable tools for non-destructive sample visualisation, delivering information inaccessible by conventional absorption imaging. X-ray phase-sensing techniques are furthermore increasingly used for at-wavelength metrology and optics characterisation. One of the latest additions to the group of differential phase-contrast methods is the X-ray speckle-based technique. It has drawn significant attention due to its simple and flexible experimental arrangement, cost-effectiveness and multimodal character, amongst others. Since its first demonstration at highly brilliant synchrotron sources, the method has seen rapid development, including the translation to polychromatic laboratory sources and extension to higher-energy X-rays. Recently, different advanced acquisition schemes have been proposed to tackle some of the main limitations of previous implementations. Current applications of the speckle-based method range from optics characterisation and wavefront measurement to biomedical imaging and materials science. This review provides an overview of the state of the art of the X-ray speckle-based technique. Its basic principles and different experimental implementations as well as the the latest advances and applications are illustrated. In the end, an outlook for anticipated future developments of this promising technique is given.

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More information

Accepted/In Press date: 17 April 2018
e-pub ahead of print date: 25 April 2018
Published date: May 2018
Keywords: Metrology, Optics characterisation, X-ray dark-field imaging, X-ray multimodal imaging, X-ray near-field speckle, X-ray phase tomography, X-ray phase-contrast imaging, X-ray speckle-based imaging, X-ray wavefront sensing

Identifiers

Local EPrints ID: 439034
URI: http://eprints.soton.ac.uk/id/eprint/439034
ISSN: 0897-1889
PURE UUID: 4b2c9083-e150-42ff-80a2-c5de7260b31b

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Date deposited: 01 Apr 2020 16:33
Last modified: 01 Apr 2020 16:36

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