Zdora, Marie-Christine, Thibault, Pierre, Deyhle, Hans, Vila-Comamala, Joan, Kuo, Willy, Rau, Christoph and Zanette, Irene (2018) Advanced X-ray phase-contrast and dark-field imaging with the unified modulated pattern analysis (UMPA). Microscopy and Microanalysis, 24 (S2), 22-23. (doi:10.1017/s1431927618012539).
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Published date: 18 May 2018
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14th International Conference on X-ray Microscopy, Saskatoon, Saskatchewan, Canada, 2018-08-19 - 2018-08-24
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Local EPrints ID: 439071
URI: http://eprints.soton.ac.uk/id/eprint/439071
ISSN: 1431-9276
PURE UUID: 179e6a96-2682-4975-97d9-e0b2984ca80a
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Date deposited: 02 Apr 2020 16:34
Last modified: 16 Mar 2024 07:11
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Author:
Marie-Christine Zdora
Author:
Pierre Thibault
Author:
Hans Deyhle
Author:
Joan Vila-Comamala
Author:
Willy Kuo
Author:
Christoph Rau
Author:
Irene Zanette
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