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High resolution X-ray tomography of micromechanisms of fatigue crack closure

High resolution X-ray tomography of micromechanisms of fatigue crack closure
High resolution X-ray tomography of micromechanisms of fatigue crack closure
Fatigue crack closure has been studied in an aluminium alloy via micro tomography. Gallium wetting has been used to visualise grain structure, along with electron backscattered diffraction assessment of grain orientations and crack trajectories. Through this synthesis of techniques, a detailed direct assessment of microstructure and closure micromechanisms has been achieved.
1359-6462
47-50
Khor, K.H.
c346626b-924f-413b-bde4-cf7b41f61921
Buffiere, J.Y.
4b843432-c0fc-485d-9c5d-e5274f9cde17
Ludwig, W.
b9c8b7d7-3d81-42d7-8ef0-ddc26bb7fbdd
Sinclair, I.
6005f6c1-f478-434e-a52d-d310c18ade0d
Khor, K.H.
c346626b-924f-413b-bde4-cf7b41f61921
Buffiere, J.Y.
4b843432-c0fc-485d-9c5d-e5274f9cde17
Ludwig, W.
b9c8b7d7-3d81-42d7-8ef0-ddc26bb7fbdd
Sinclair, I.
6005f6c1-f478-434e-a52d-d310c18ade0d

Khor, K.H., Buffiere, J.Y., Ludwig, W. and Sinclair, I. (2006) High resolution X-ray tomography of micromechanisms of fatigue crack closure. Scripta Materialia, 55 (1), 47-50. (doi:10.1016/j.scriptamat.2006.01.016).

Record type: Article

Abstract

Fatigue crack closure has been studied in an aluminium alloy via micro tomography. Gallium wetting has been used to visualise grain structure, along with electron backscattered diffraction assessment of grain orientations and crack trajectories. Through this synthesis of techniques, a detailed direct assessment of microstructure and closure micromechanisms has been achieved.

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More information

Published date: July 2006
Organisations: Engineering Mats & Surface Engineerg Gp

Identifiers

Local EPrints ID: 43946
URI: http://eprints.soton.ac.uk/id/eprint/43946
ISSN: 1359-6462
PURE UUID: fde21484-eda0-4998-afba-e48236dcde4c

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Date deposited: 06 Feb 2007
Last modified: 15 Mar 2024 08:59

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Contributors

Author: K.H. Khor
Author: J.Y. Buffiere
Author: W. Ludwig
Author: I. Sinclair

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