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X-ray phase imaging with the unified modulated pattern analysis of near-field speckles at a laboratory source

X-ray phase imaging with the unified modulated pattern analysis of near-field speckles at a laboratory source
X-ray phase imaging with the unified modulated pattern analysis of near-field speckles at a laboratory source
X-ray phase-contrast techniques are powerful methods for discerning features with similar densities, which are normally indistinguishable with conventional absorption contrast. While these techniques are well-established tools at large-scale synchrotron facilities, efforts have increasingly focused on implementations at laboratory sources for widespread use. X-ray speckle-based imaging is one of the phase-contrast techniques with high potential for translation to conventional x-ray systems. It yields phase-contrast, transmission, and dark-field images with high sensitivity using a relatively simple and cost-effective setup tolerant to divergent and polychromatic beams. Recently, we have introduced the unified modulated pattern analysis (UMPA) [Phys. Rev. Lett. 118, 203903 (2017) [CrossRef] ], which further simplifies the translation of x-ray speckle-based imaging to low-brilliance sources. Here, we present the proof-of-principle implementation of UMPA speckle-based imaging at a microfocus liquid-metal-jet x-ray laboratory source.
0003-6935
2270-2275
Zdora, Marie-Christine
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Zanette, Irene
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Walker, Toby
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Phillips, Nicholas
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Smith, Ronan
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Deyhle, Hans
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Ahmed, Sharif
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Thibault, Pierre
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Zdora, Marie-Christine
a2e3b04b-aef4-42f8-9e96-4707149589fb
Zanette, Irene
39ee899c-0aae-4fac-aec6-826f848a8022
Walker, Toby
8bf46e22-4e1d-4dd2-8e78-1c8ee05b60df
Phillips, Nicholas
ed10e62a-d80a-4584-8375-1775ac1bc2da
Smith, Ronan
1fb08494-58d7-4532-8fcc-df7b02cd6369
Deyhle, Hans
aba9cd34-97a0-4238-8255-af673e3beb1a
Ahmed, Sharif
e7181acb-a5ad-4712-b6bd-4c4dfbf6a9dc
Thibault, Pierre
975a4c7b-6ca9-4958-b362-9eba10ab926b

Zdora, Marie-Christine, Zanette, Irene, Walker, Toby, Phillips, Nicholas, Smith, Ronan, Deyhle, Hans, Ahmed, Sharif and Thibault, Pierre (2020) X-ray phase imaging with the unified modulated pattern analysis of near-field speckles at a laboratory source. Applied Optics, 59 (8), 2270-2275. (doi:10.1364/AO.384531).

Record type: Article

Abstract

X-ray phase-contrast techniques are powerful methods for discerning features with similar densities, which are normally indistinguishable with conventional absorption contrast. While these techniques are well-established tools at large-scale synchrotron facilities, efforts have increasingly focused on implementations at laboratory sources for widespread use. X-ray speckle-based imaging is one of the phase-contrast techniques with high potential for translation to conventional x-ray systems. It yields phase-contrast, transmission, and dark-field images with high sensitivity using a relatively simple and cost-effective setup tolerant to divergent and polychromatic beams. Recently, we have introduced the unified modulated pattern analysis (UMPA) [Phys. Rev. Lett. 118, 203903 (2017) [CrossRef] ], which further simplifies the translation of x-ray speckle-based imaging to low-brilliance sources. Here, we present the proof-of-principle implementation of UMPA speckle-based imaging at a microfocus liquid-metal-jet x-ray laboratory source.

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Accepted/In Press date: 30 January 2020
e-pub ahead of print date: 30 January 2020
Published date: 10 March 2020
Additional Information: © 2020 Optical Society of America. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved

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Local EPrints ID: 439492
URI: http://eprints.soton.ac.uk/id/eprint/439492
ISSN: 0003-6935
PURE UUID: dbc86983-124f-4c22-8795-e5952dc6c255
ORCID for Ronan Smith: ORCID iD orcid.org/0000-0002-5748-9295
ORCID for Pierre Thibault: ORCID iD orcid.org/0000-0003-1278-8846

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Date deposited: 24 Apr 2020 16:30
Last modified: 18 Feb 2021 17:38

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