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Reflection and transmission calculations in a multilayer structure with coherent, incoherent, and partially coherent interference, using the transmission line method

Reflection and transmission calculations in a multilayer structure with coherent, incoherent, and partially coherent interference, using the transmission line method
Reflection and transmission calculations in a multilayer structure with coherent, incoherent, and partially coherent interference, using the transmission line method

A generalized transmission line method (TLM) that provides reflection and transmission calculations for a multilayer dielectric structure with coherent, partial coherent, and incoherent layers is presented. The method is deployed on two different application fields. The first application of the method concerns the thickness measurement of the individual layers of an organic light-emitting diode. By using a fitting approach between experimental spectral reflectance measurements and the corresponding TLM calculations, it is shown that the thickness of the films can be estimated. The second application of the TLM concerns the calculation of the external quantum efficiency of an organic photovoltaic with partially coherent rough interfaces between the layers. Numerical results regarding the short circuit photocurrent for different layer thicknesses and rough interfaces are provided and the performance impact of the rough interface is discussed in detail.

1559-128X
1492-1504
Stathopoulos, N. A.
83a4653f-c4c8-464a-8ed1-a93c52cf3833
Savaidis, S. P.
a1ae5de3-1411-46ff-b47e-b1c91ee0b3dd
Botsialas, A.
b23cb54a-8266-4389-b188-f96c206cd6d2
Ioannidis, Z. C.
da69697f-42e2-4776-a7e8-7c4ddcfa1117
Georgiadou, D. G.
84977176-3678-4fb3-a3dd-2044a49c853b
Vasilopoulou, M.
aad1381e-d091-4090-8c7c-b74bed22393d
Pagiatakis, G.
dd0bd646-d607-4253-a2e9-3db4ca715005
Stathopoulos, N. A.
83a4653f-c4c8-464a-8ed1-a93c52cf3833
Savaidis, S. P.
a1ae5de3-1411-46ff-b47e-b1c91ee0b3dd
Botsialas, A.
b23cb54a-8266-4389-b188-f96c206cd6d2
Ioannidis, Z. C.
da69697f-42e2-4776-a7e8-7c4ddcfa1117
Georgiadou, D. G.
84977176-3678-4fb3-a3dd-2044a49c853b
Vasilopoulou, M.
aad1381e-d091-4090-8c7c-b74bed22393d
Pagiatakis, G.
dd0bd646-d607-4253-a2e9-3db4ca715005

Stathopoulos, N. A., Savaidis, S. P., Botsialas, A., Ioannidis, Z. C., Georgiadou, D. G., Vasilopoulou, M. and Pagiatakis, G. (2015) Reflection and transmission calculations in a multilayer structure with coherent, incoherent, and partially coherent interference, using the transmission line method. Applied Optics, 54 (6), 1492-1504. (doi:10.1364/AO.54.001492).

Record type: Article

Abstract

A generalized transmission line method (TLM) that provides reflection and transmission calculations for a multilayer dielectric structure with coherent, partial coherent, and incoherent layers is presented. The method is deployed on two different application fields. The first application of the method concerns the thickness measurement of the individual layers of an organic light-emitting diode. By using a fitting approach between experimental spectral reflectance measurements and the corresponding TLM calculations, it is shown that the thickness of the films can be estimated. The second application of the TLM concerns the calculation of the external quantum efficiency of an organic photovoltaic with partially coherent rough interfaces between the layers. Numerical results regarding the short circuit photocurrent for different layer thicknesses and rough interfaces are provided and the performance impact of the rough interface is discussed in detail.

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Accepted/In Press date: 20 January 2015
Published date: 20 February 2015

Identifiers

Local EPrints ID: 440523
URI: http://eprints.soton.ac.uk/id/eprint/440523
ISSN: 1559-128X
PURE UUID: cbb89bb1-5e0c-46ef-8860-a1beb2ce4cd8
ORCID for D. G. Georgiadou: ORCID iD orcid.org/0000-0002-2620-3346

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Date deposited: 06 May 2020 16:31
Last modified: 07 Oct 2020 02:27

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Contributors

Author: N. A. Stathopoulos
Author: S. P. Savaidis
Author: A. Botsialas
Author: Z. C. Ioannidis
Author: M. Vasilopoulou
Author: G. Pagiatakis

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