Tyson, Jack James, Rahman, Tasmiat and Boden, Stuart (2020) Angular-resolved hemispherical reflectometry for the optical characterisation of material surfaces. The 16th Photovoltaic Science, Application and Technology Conference, , Salford, United Kingdom. (In Press)
Abstract
Reported here is the development of a broadband, angular-resolved and polarised hemispherical reflectometer. Such devices are able to provide succinct and meticulous data regarding the optical response characteristics of a given surface. We investigate such characteristics of a variety of materials featuring surface texturing and report a comprehensive analysis of the data returned. Our findings demonstrate the key role played by both the micro- and nano-scale features of a given surface topology on the wide-angle anti-reflectance properties of that surface.
Full text not available from this repository.
More information
Identifiers
Catalogue record
Export record
Contributors
University divisions
- Current Faculties > Faculty of Engineering and Physical Sciences > School of Electronics and Computer Science
School of Electronics and Computer Science - Current Faculties > Faculty of Engineering and Physical Sciences > School of Electronics and Computer Science > Sustainable Electronic Technologies
School of Electronics and Computer Science > Sustainable Electronic Technologies
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.