Zheludev, Nikolai (2019) Far-field deeply subwavelength imaging and metrology: Bringing artificial intelligence to nanophotonics. The International Symposium on Plasmonics and Nano-photonics, Hyogo, Kobe, Japan. 11 - 14 Nov 2019.
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Published date: 11 November 2019
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The International Symposium on Plasmonics and Nano-photonics, Hyogo, Kobe, Japan, 2019-11-11 - 2019-11-14
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Local EPrints ID: 441721
URI: http://eprints.soton.ac.uk/id/eprint/441721
PURE UUID: 0af17dfb-4e52-495c-9835-fa11b5713c0d
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Date deposited: 24 Jun 2020 16:49
Last modified: 23 Feb 2024 02:33
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Author:
Nikolai Zheludev
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